COS Automatic Test System
Classification:
PSS COS Automatic Test System (PSS COST22401) supports comprehensive LIV testing and spectral testing at room/high temperature for CW-DFB laser chips in COS package form. It supports us-level DC/pulse output and measurement. The system adopts dual-station testing with fully automatic robotic loading and unloading. It features high integration, high efficiency, high stability, and simple maintenance and operation.
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Application
Chip performance testing for applications such as AI computing clusters, silicon optical modules, and CPO core light sourcesFeatures
1. Dual temperature-controlled stages with independent temperature control, greatly improving testing efficiency
2. Adopting robotic automatic loading and unloading to reduce manual operations, and improve testing efficiency and reliability
3. A combination of collimating lens and multimode fiber is used for light collection to test the spectral characteristics of devices, and automatic coupling algorithm is adopted for coupling
4. The system uses TEC for temperature control, featuring stable temperature and fast heating and cooling speeds
5. Support local and remote SQL databases, as well as industrial production MES systems
6. The test fixture is shared with the burn-in system, without intermediate material transferSpecification
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