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Data Communication VCSEL Wafer Testing

Classification:

PSS optical communication VCSEL tester is used for Wafer testing of surface-emitting VCSELs. It supports LIV and spectrum-related parameter testing of chips, automatic visual recognition, and fully automatic testing of each chip. It supports both normal temperature and high temperature testing. The high temperature test temperature can be customized by the user. It is compatible with Wafers of various sizes. The measurement database is open to users for subsequent screening processes.

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- Commodity name: Data Communication VCSEL Wafer Testing
- 型号: PSS WT-8502
- Describe: 850nm VCSEL wafer test, supporting tests of LIV and spectrum related parameters
PSS optical communication VCSEL tester is used for Wafer testing of surface-emitting VCSELs. It supports LIV and spectrum-related parameter testing of chips, automatic visual recognition, and fully automatic testing of each chip. It supports both normal temperature and high temperature testing. The high temperature test temperature can be customized by the user. It is compatible with Wafers of various sizes. The measurement database is open to users for subsequent screening processes.

Application
1. VCSEL chip testing for optical communications and other applications
2. Verification testing of low-power surface-emitting chips

Features
1. Integrated self-made LIV comprehensive tester, high precision of small current gear, supporting LIV test

2. Integrating sphere synchronously collecting light, supporting LIV test and spectrum test

3. Probe arm, pin pressure adjustable, minimum adjustment to 1g, pressure stability within ±0.1g, probe installation with limit function

4. Support wafer position recognition and automatic adjustment
5. The test platform adopts high thermal conductivity material, TEC temperature control, the temperature range can support 25~85°C
6. Support fast spectrum test
7. The software supports precise positioning map, coordinate data generation, and the database automatically stores data and pictures

Specification
Product Features

• Integrated self-made LIV comprehensive tester, high precision in low current range, supports LIV testing

• Integrating sphere synchronous light collection, supporting LIV testing and spectral testing

• Probe arm, adjustable needle pressure, minimum adjustable to 1g, pressure stability within ±0.1g, probe installation with limit function

• Supports wafer position recognition and automatic adjustment
• The test platform uses high thermal conductivity materials, TEC temperature control, and the temperature range supports 25~85°C
• Supports fast spectral testing

• Software supports precise positioning map, coordinate data generation, and database automatic storage of data and images

Parameters	Indicators
Suitable Wafer Sizes	2-inch, 4-inch, and 6-inch
Chip Powering Method	Supports same-side and different-side VCSEL powering
Current Range	Range 0-500mA
Current Output and Measurement Accuracy	0~20mA：0.1%FS±0.1mA 0~100mA：0.1%FS±0.1mA 0~250mA：0.1%FS±0.25mA 0~500mA：0.1%FS±0.5mA
Current Powering Method	Supports continuous current scanning and pulse powering: pulse width 200us~650ms, cycle 2ms~6s, synchronous output trigger signal
Forward Optical Power	Range 0-500mW, accuracy 0.1%FS±50uW
Forward Voltage	Range 0-5V, accuracy 0.5%±50mV
Wavelength Range	800-1700 nm, other wavelengths support customization
Test Bench Temperature Control Range	25～85℃, stability <±1℃
Equipment Dimensions	Excluding signal lights and display, 1250mm(depth) × 1100mm(width) × 1750mm(height)
Gas Source Requirements	Positive pressure: None Negative pressure: ≤-80KPa