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Optional divergence angle test


Visible Light BAR automatic tester is used for automatic measurement of bar LIV curve, spectrum and far field. Fully automatic loading and unloading, support material box loading, support material box or blue film unloading. Normal temperature and high temperature dual temperature test, the test temperature can be set by the user. The probe is powered on, the test NG chip is marked with dots, and the measurement database is opened to the user for subsequent screening procedures.


  • Application
  • Characteristic
  • Specifications
  • Download
    • Commodity name: Optional divergence angle test
    • 型号: PSS BarT-HP-us series
    • Describe: Compatible with DC, Pulse power-up

    Visible Light BAR automatic tester is used for automatic measurement of bar LIV curve, spectrum and far field. Fully automatic loading and unloading, support material box loading, support material box or blue film unloading. Normal temperature and high temperature dual temperature test, the test temperature can be set by the user. The probe is powered on, the test NG chip is marked with dots, and the measurement database is opened to the user for subsequent screening procedures.

    Product Application

    • The equipment is used for automatic testing of visible light BAR, which can realize the spectrum and LIV parameter testing of edge-emitting chips under normal temperature and high temperature conditions.

  • Product Features

    • Supports a variety of mainstream specifications of the material box, automatic loading and unloading, avoiding the scrapping of the bar chip caused by material transfer or manual operation.

     

     

    • The loading and unloading material boxes are equipped with magnetic suction fixtures, which support quick replacement of different specifications of material boxes or blue film discs.
    • Support automatic loading of BAR strips, identification and positioning of the first chip, support for ID identification, automatic testing, automatic judgment of the end of BAR strip testing, and automatic unloading.

     

     

    • Adjustable contact pressure between suction nozzle, probe and bar.
    • Support single-probe, double-probe, and multi-probe power-on configurations.

     

     

    • Support front light LIV curve, power, spectrum measurement, backlight power measurement, multi-parameter and multi-condition screening, screen out bad chips as much as possible, and avoid flowing into subsequent processes.
    • Support MAP drawing, which is convenient for users to analyze the performance distribution of wafers.

     

     

    • Support NG Chip dot marking, support simple chip appearance inspection.
    • Support normal temperature and high temperature test, normal temperature platform supports temperature control.
    • Multi-dimensional adjustable measurement structure to meet the user's needs for measuring bars of different specifications.

  • Parameters

    Description/Value

    Suitable bar size

    length:15~30mm

    width:0.2~0.5mm,other bar width can customize test platforms.

    Instrument model

    Keithley 2601B-PULSE

    Measurement parameters

    LIV curve,Ith,Po,Vf,Im,Rs,SE,Kink etc.

    LD drive current

    Low power chip range 0 ~ 300mA, accuracy 0.1%FS±0.5mA

    High power chip range 0 ~ 5A, accuracy 0.1%FS±5mA

    Current mode

    CW/Pulse

    P-I-V

    Pulse 0.1ms (ON) Duty1%

    Forward voltage test

    Low power chip range 0 ~ 15.0V, accuracy 0.1% FS±50mV

    High power chip range 0 ~ 10.0V, accuracy 0.1% FS±50mV

    Optical power test

    Small power chip test range 0-300mW; accuracy 0.1% FS±50uW; wavelength range 380-700nm

    High-power chip test range 0-10W; accuracy 0.1% FS±10mW; wavelength range 380-700nm

    Temperature control

    Normal temperature: 20~85℃; stability ≤ ±0.5℃

    Air source requirements

    Positive pressure: >0.6MPa  Negative pressure: <-80KPa

    Power supply

    AC 220V/8A 50Hz