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Optional divergence angle test


This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.


  • Application
  • Characteristic
  • Specifications
  • Download
    • Commodity name: Optional divergence angle test
    • 型号: PSS CHIP11405-P series
    • Describe: Compatible with DC, Pulse power-up

    This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.

    Product application

    • The equipment is used for automatic test and classification of visible laser bare chips, it achieves the spectrum and LIV parameter testing of edge-emitting chips under normal temperature and high temperature conditions

  • Product features

    • Support Chip LIV, spectrum related parameter test, draw test curve

     

     

    • Chips use blue film automatic loading,and automatic identify chip ID through vision system. The test bench supports automatic secondary positioning of the chip under the camera, and precisely controls the power-on test of the probe

     

     

    • The probe is automatic pressing down to power-on, probe’s press down intensity is adjustable , support real-time display of the probe intensity

    • Unloading configuration includes 8 blue film disks and 4 2-inch GelPak boxes

     

     

    • Picking and handling mechanism (composed of loading and unloading suction nozzle, the handling axis is controlled by high-precision linear motor), with good stability and high motion precision

     

     

    • Achieve low-power test and high-power test: low-power test system (air cooling + TEC temperature control; 1-inch integrating sphere to collect light, measure PIV, spectrum), (reserved) high-power test system (water cooling + TEC temperature control; 3-inch integrating sphere to collect light, measure PIV, spectrum)

     

  • Parameters

    Description/Value

    Suitable chip size

    L x W : 200-2000 μm x 120-300 μm

    Other sizes can choose customized test platforms

    Instrument model

    (Keithley)2601B-PULSE

    Measurement parameter

    LIV curve,Ith,Po,Vf,Im,Rs,SE,Kink Etc.

    LD driving current

    The low-power chip range 0~300mA, accuracy 0.1%FS±0.5mA

    The high-power chip range 0~5A ,accuracy 0.1%FS±5mA

    Current mode

    CW/Pulse

    P-I-V

    Pulse 0.1ms (ON) Duty1%

    Forward voltage test

    The low-power chip range 0 ~15.0V, accuracy 0.1% FS±50mV

    The high-power chip range 0 ~10.0V , accuracy 0.1% FS±50mV

    Reverse current test

    0 ~ 100nA,accuracy 1% FS±1.0nA,@<50%RH

    0 ~ 1uA,accuracy 0.1% FS±10nA,@<50%RH

    0 ~ 10uA,accuracy 0.1% FS±0.1uA,@<50%RH

    0 ~ 100uA,accuracy 0.1% FS±1uA,@<50%RH

    0 ~ 1mA,accuracy 0.1% FS±10uA,@<50%RH

    Reverse voltage test

    range 0 ~ 30.0V,accuracy 0.1% FS±0.3V

    Optical power test

    The low-power chip ranges : 0-300mW;accuracy 0.1% FS±50uW;wavelength range 380-700nm

    The high-power chip ranges : 0-10W;accuracy 0.1% FS±10mW;wavelength range 380-700nm

    Temperature control

    range:20~85℃;stability≤ ±0.5℃

    Equipment size

    2050mm×1800mm×2090mm(L×W×H)

    Air supply requirements

    Positive pressure:>0.6MPa     Negative pressure:<-80KPa

    Power supply

    AC 220V/8A 50Hz