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DFB (single needle) bar tester

Classification:


PSS EML BAR automatic testing machine is used for LD bar LIV curve, spectrum, backlight automatic measurement, EA power-up test, SOA power-on test. Fully automatic loading and unloading, support multi-specification box loading or multi-specification box or blue film unloading. Room temperature and high temperature test are acceptable, and high temperature test can be customized by the user. The measurement database is opened to the user to subsequent sorting processes.


  • Application
  • Characteristic
  • Specifications
  • Download
    • Commodity name: DFB (single needle) bar tester
    • 型号: PSS BAR-VI(D)
    • Describe: Compatible with DC, Pulse power-up

    PSS EML BAR automatic testing machine is used for LD bar LIV curve, spectrum, backlight automatic measurement, EA power-up test, SOA power-on test. Fully automatic loading and unloading, support multi-specification box loading or multi-specification box or blue film unloading. Room temperature and high temperature test are acceptable, and high temperature test can be customized by the user. The measurement database is opened to the user to subsequent sorting processes.

    Product Introduction

    • The equipment is used for DFB/EML BAR automatic test, which can test the spectrum of the edge emission chip and the LIV parameters under normal temperature and high temperature conditions.

  • Product Features

    • Support a variety of mainstream specification boxes, fully automatic loading and unloading, to avoid the scrapping caused by transfer or manual operation.

     


    • The loading and unloading boxes are equipped with magnetic grippers, quick replacement of different specifications of boxes or blue film trays.
    • Support BAR automatic loading, first chip identification and positioning, ID recognition, automatic testing, automatic test judgment of BAR, and automatic unloading.

     


    • The adjustable contact pressure between nozzle, probe and BAR 
    • Support single probe, double probe, multi-probe power-up form

     

     

    • Support front-light LIV curve, power, spectrum measurement, backlight power measurement, EA, SOA and related testing, multi-parameter and multi-condition screening and sorting out bad chips to avoid flowing into the next process

     


    • Support MAP diagram drawing, convenient for users to analyze the performance distribution of wafer

     


    • Support NG Chip dot marking, and simple chip visual inspection
    • Support normal temperature and high temperature test, normal temperature platform supports temperature control
    • Multi-dimensional adjustable measurement structure to meet the needs of users for different specifications of bar measurement

  • Parameters

    Description/Value

    Suitable bar size

    length:15~30mm

    width:0.2~0.5mm,other BAR widths can be customized

    Main parameters

    LIV curve,Ith,Po,Vf,Im,Rs,SE,Kink,spectral parameters, etc

    LD drive current

    Range 0-250mA, maximum can be customized to 500mA

    Current power-on mode

    Support continuous current sweep, pulse output

    Front-light integrating sphere detection power

    Range 0-100mW

    Backlight current measurement

    Range 0-3000uA

    EA voltage output

    Range -5V~+5V

    EA current test

    Range -200mA~+200mA

    Far-field divergence angle test

    Range ±45°

    Test efficiency

    (typical) [1]

    Single chip room temperature + high temperature test time: LIV + spectrum (1 point) + ID recognition + total mechanical movement time≤ 9s

    Wavelength range

    Support customization

    High temperature table temperature control range

    Room temperature +15~125℃

    Temperature control range of normal temperature platform

    Room temperature -50℃

    Power supply

    AC 220V/6A 50Hz