LiNbO3 Automatic Test System
Classification:
PSS Normal/High-Temperature Thin-film Lithium Niobate Automatic Tester (PSS CHIP-LiNbO₃) is applied to the coupling test of lithium niobate (LiNbO₃) chips, supporting the testing of optoelectronic characteristics including thermal resistance, thermal tuning power, half-wave voltage and spectrum. Adopting a single load platform per test system, the platform temperature control range is 25~85℃. It features fully automatic loading and unloading. Measurement data is open to users for subsequent sorting processes.
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Application
Performance test of thin-film lithium niobate chips for optical communicationFeatures
1. Fully automatic loading and unloading, compatible with 6-inch wafer expander ring loading/unloading
2. Probe card power-on testing
3. Single test system with a single stage
4. Comprehensive test functions, supporting tests of thermal resistance, thermal tuning power, extinction ratio, minimum insertion loss, half-wave voltage and spectrum, as well as OCR recognition for chip coding
5. The software supports multi-parameter and multi-condition screening to filter out defective chips as much as possible and prevent them from flowing into subsequent processes
6. The software interface enables real-time display of test status, as well as abnormal alarm prompts and log recording during production
7. Electrostatic protection: All materials in contact with chips adopt anti-static materials and are properly grounded; an ion fan for static elimination is equipped at the loading station
8. Adopt self-developed source meter, featuring strong equipment compatibility and scalabilitySpecification
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