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EML TO Burn-in Test System


PSS EML TO integrated burn-in test system is used for burn-in screening and reliability life analysis of EML TO devices. The system supports a maximum of 1536 device burn-in, by controlling the temperature of the external environment or the high temperature of the TEC inside the device,it provides constant current for LD devices to achieve burn-in of EML devices. The system can display the burn-in current, backlight current, forward voltage, EA current etc parameters in real time and the graphics are intuitively displayed, which is convenient for observing abnormal conditions in the burn-in process. The general burn-in board is compatible with our EML TO disk test system, which significantly improves the test efficiency and the quality of TO products.


  • Application
  • Characteristic
  • Specifications
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    • Commodity name: EML TO Burn-in Test System
    • 型号: PSS EMLBI11536/21536
    • Describe: support EML TO burn-in,up to 1536 channels

    PSS EML TO integrated burn-in test system is used for burn-in screening and reliability life analysis of EML TO devices. The system supports a maximum of 1536 device burn-in, by controlling the temperature of the external environment or the high temperature of the TEC inside the device,it provides constant current for LD devices to achieve burn-in of EML devices. The system can display the burn-in current, backlight current, forward voltage, EA current etc parameters in real time and the graphics are intuitively displayed, which is convenient for observing abnormal conditions in the burn-in process. The general burn-in board is compatible with our EML TO disk test system, which significantly improves the test efficiency and the quality of TO products.

    Product applicatio

    • Burn-in screening of EML TO devices in mass production
    • Long-term reliability failure test analysis

     

     

  • Product features

    • Hardware supports SOA power supply, perfectly compatible with EML lasers with PD or SOA
    • Support Im scan calculating Ith

     

     

    • 32-channel burn-in board as a universal carrier, it can achieve the direct transfer of different stations for disk testing and burn-in, and improve production efficiency
    • Each burn-in board can be configured with different parameters for burn-in, and the burn-in parameters are stable and reliable

     

     

    • Support hot swap, perfect EOS protection, ensure the safety of devices during burn-in progress

     

  • Parameters

    Description/Value

    Burn-in scale

    1536

    LD drive current 

    0~250mA

    SOA drive current 

    0~250mA

    PD reversed bias voltage

    0~5V

    LD forward voltage

    0~5V

    LD monitor current

    0~250mA

    SOA monitor current

    0~250mA

    PD monitor current

    0~2000uA

    EA voltage

    0~-5V

    EA current

    0~200mA

    LIV scanning

    Support Im scan calculation Ith

    Temperature control mode

    Support external environment temperature control and TEC temperature control

    TEC current range

    -1A~+1A

    Temperature range

    Ambient temperature Control:RT+20℃~150℃

    Device internal TEC temperature control:RT~130℃

    Temperature stability

    ±0.5℃

    Data base

    The system has its own SQL database, which can recall and store the data of LD test

    Power supply specification

    AC 380V/50HZ

    Power

    AC 380V 7000W