+
  • 产品01.jpg

LD Integrated Burn-in System


LD integrated reliability system is used for burn-in screening and reliability life analysis of various types of packaged LD devices. The system can define and provide up to 500mA drive current and 150°C high-temperature burn-in conditions through software configuration pins. At the same time, it can monitor and test the drive current, backlight current and threshold of the device in real time, and automatically judge product failure. Real-time storage of monitoring data to support data retrieval of aging and failed devices. Support single burn-in of up to 3072pcs.


  • Application
  • Characteristic
  • Specifications
  • Download
    • Commodity name: LD Integrated Burn-in System
    • 型号: PSS LDBI13003
    • Describe: support DML TO burn-in, up to 3072 channels

    LD integrated reliability system is used for burn-in screening and reliability life analysis of various types of packaged LD devices. The system can define and provide up to 500mA drive current and 150°C high-temperature burn-in conditions through software configuration pins. At the same time, it can monitor and test the drive current, backlight current and threshold of the device in real time, and automatically judge product failure. Real-time storage of monitoring data to support data retrieval of aging and failed devices. Support single burn-in of up to 3072pcs.

    Product Application

    • Burn-in screening of LDTO devices in mass production
    • Long-time reliability failure test analysis

     

     

  • Product Features

    • Provide each channel with completely independent drive current
    • Software switching supports burn-in of various types of packaged LD devices

     

     

    • Two independent aging boxes can be completely independently controlled, with high heating rate and no overshoot

     

     

    • Support multiple algorithms to calculate Ith
    • Support hot swap, reliable ESD/EOS protection, ensure safety during device burn-in

     

     

    • Support the online record function of burn-in board monitoring and plugging times
    • The 64-channel burn-in board is used as a universal carrier, which can realize disk testing, burn-in, and sorting, and directly transfer materials to different stations to improve production efficiency

  • Parameter

    Description/Value

    Number of test channels

    64 channels on a single board, 2 boxes on the left and right, 24 on each floor, a total of 3072 channels

    Number of independent temperature zones

    2

    LD drive current

    0~250mA

    LD forward voltage

    0~3V

    LD monitor current

    0~250mA

    PD monitor current

    0~2000uA

    Pin definition

    Software switching supports devices in various package types

    Ith scanning

    Support Im scan calculation Ith

    Temperature range

    RT+20℃~150℃

    Temperature accuracy

    ±2℃

    Temperature uniformity

    full load≤3℃, no load≤2℃

    Heating Overshoot

    ≤3℃

    long-term temperature stability

    0.5℃

    Heating rate

    100℃/ half an hour

    Dimensions (WxHxD)

    1400 x 1800 x 1200(mm)

    Power Specifications

    Three-phase five-wire AC 380V/50HZ