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Narrow Pulse TO Tester

Classification:


The narrow pulse TO test system is mainly used for the automatic test of LIV, spectrum and divergence angle of TO. The equipment supports automatic loading and unloading of TO/COB, which is compatible with the loading and unloading vehicles used by customers. The test bench supports temperature control and can realize the test of TO at the set temperature. The system is fully automatic, stable and efficient, which is convenient for customers to test in mass production. It is a complete set of high-power narrow-pulse TO reliability experimental solution, which is used in conjunction with the burn-in system of high-power narrow-pulse TO drawers. The narrow-pulse TO testing system supports testing and comparison before and after burn-in, data storage and analysis.


  • Application
  • Characteristic
  • Specifications
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    • Commodity name: Narrow Pulse TO Tester
    • 型号: PSS PLS-T-S640
    • Describe: 100ns narrow pulse test, support TO56、COB and other types

    The narrow pulse TO test system is mainly used for the automatic test of LIV, spectrum and divergence angle of TO. The equipment supports automatic loading and unloading of TO/COB, which is compatible with the loading and unloading vehicles used by customers. The test bench supports temperature control and can realize the test of TO at the set temperature. The system is fully automatic, stable and efficient, which is convenient for customers to test in mass production. It is a complete set of high-power narrow-pulse TO reliability experimental solution, which is used in conjunction with the burn-in system of high-power narrow-pulse TO drawers. The narrow-pulse TO testing system supports testing and comparison before and after burn-in, data storage and analysis.

    Product Application

    Performance test of TO/COB package for high-power laser applications such as 3D sensor and lidar.
    Suitable for laboratory verification or small batch testing.

     

  • Product Features

    Integrated self-developed ultra-narrow pulse SMU, and the minimum pulse to 100ns, maximum current 30A.
    The pulse ensures a flat top area, supports peak detection, and ensures the authenticity of the test.
    The test platform is made of high thermal conductivity material, with TEC temperature control, and the temperature range is 25 ~ 85 C.
    ​​​​​​​The test is compatible with the burn-in fixture, and there is no need to change materials.
    ​​​​​​​Support for rapid spectral testing
    ​​​​​​​Support far-field divergence angle test
    ​​​​​​​Support near-field testing, uniformity and bad point detection

     

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  • Parameters

    Description/Value

    Test type

    TO56、COB

    Pulse current output

    0~30A

    Pulse performance

    Pulse width: ≥ 100ns;

    Duty ratio: ≤0.1%

    Pulse current measurement

    0~30A

    Pulse voltage output

    0~40V

    Pulse voltage measurement

    0~40V

    Optical power detection

    External integrating sphere, power range: 10W~200W.

    Temperature control mode

    TEC temperature control

     

    Temperature control performance

     

    Temperature control range: 25℃~+85℃

    Temperature control fluctuation: ±0.5℃

    Temperature control speed: raise the temperature by 15℃/min, lower the temperature by 10℃/min, @25℃~85℃

    Spectral test function

    support

    Near-field test function

    1. Number of luminous holes 2. Number of holes of dark spots 3. Uniformity 4. Test area: 2*2mm.

    Test efficiency

    LIV test time is less than 4s (scanning 1000 points/pulse period 1ms)

    Time of LIV test and spectrum test is less than 7s (scanning 1000 points/pulse period 1ms)

    Input power supply

    AC220V/50Hz/ 8A

    Gas source condition

    Positive pressure: ≥0.5MPa, flow rate 120L/min.