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TO56 Automatic Disk Test System

Classification:


PSS visible laser TO automatic disk tester can realize automatic LIV comprehensive test and spectrum test of TO56, support any pin package test of TO56, and use a test board to test 64 TO56, which has the characteristics of high integration, high speed and high stability. The system and our integrated burn-in box form a complete set of visible laser TO reliability experimental solution, and the burn-in board is compatible with sorting equipment, which can improve the efficiency of factory production and testing.


  • Application
  • Characteristic
  • Specifications
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    • Commodity name: TO56 Automatic Disk Test System
    • 型号: PSS PAT-56-I(E)-RGB
    • Describe: Support visible laser TO test

    PSS visible laser TO automatic disk tester can realize automatic LIV comprehensive test and spectrum test of TO56, support any pin package test of TO56, and use a test board to test 64 TO56, which has the characteristics of high integration, high speed and high stability. The system and our integrated burn-in box form a complete set of visible laser TO reliability experimental solution, and the burn-in board is compatible with sorting equipment, which can improve the efficiency of factory production and testing.

    Product Application

    • TO56 test in visible laser wavelength band
    • TO spectrum test

     

     

     

  • Product Features

    • Support any pin switching and multiple package tests.
    • Support comparison before and after burn-in, and compare various test parameters, which is convenient for failure analysis.
    • There is no overshoot during power-on, and the power-on EOS waveform is as follows (typical TypeC device power-on test).

     


    • Compatible with PSS burn-in board, which can complete TO burn-in and testing in one stop.
    • The software is easy to operate with the functions of statistics and grading, and it’s convenient for mass testing and analysis.

     

  • Parameter

    Description/Value

    Number of test channels

    Single board 64-channel

    Device type

    TO56 any pin package

    drive current

    0-250mA

    Input optical power

    0 ~ 100mW

    LD forward voltage drop

    0-10V

    LIV scan

    Continuous current scanning, minimum step of 0.1mA.

    Acquisition parameters

    Driving current, LD voltage, received optical power

    Correction function

    Support the calibration of parameters such as Po,Vf and Im.

    Detector detection wavelength

    200-1100 nm or 800-1700nm.

    database

    The system comes with SQL database, and the data of LD test can be saved when power is cut off.

    Measuring time of single material

    Typical value: 1s (PIV test)

    Determination item

    (1)LIV characteristics (2) Spectral characteristics (powered by DC, provided by spectrometer customers)

    Equipment size

    755(L)x715(W)x760(H)mm

    Power supply specification

    AC 220V/50HZ

    power consumption

    300W