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850nm Optical Wafer Tester

Classification:


PSS optical communication VCSEL testing machine is used for Wafer testing of surface emission type VCSEL, supporting the testing of LIV and spectral related parameters of the chip, visual automatic recognition, and fully automatic testing of each chip, and room temperature, high temperature and double temperature test, and the temperature can be customized by the user. Compatible with a variety of different sizes of wafers, open the measurement database to the user for subsequent screening division sequence.


  • Application
  • Characteristic
  • Specifications
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    • Commodity name: 850nm Optical Wafer Tester
    • 型号: PSS WT-8501
    • Describe: DC 15mA high precision test

    PSS optical communication VCSEL testing machine is used for Wafer testing of surface emission type VCSEL, supporting the testing of LIV and spectral related parameters of the chip, visual automatic recognition, and fully automatic testing of each chip, and room temperature, high temperature and double temperature test, and the temperature can be customized by the user. Compatible with a variety of different sizes of wafers, open the measurement database to the user for subsequent screening division sequence.

    Product Application

    • VCSEL chip testing for optical communication and other applications
    • Verification test of low-power surface transmitting chip

     

     

  • Product Features

    • Integrated self-made LIV comprehensive tester, small current gear with high precision, support LIV test

     


    • Integrating sphere synchronous light collection, LIV test and spectrum test

     


    • probe arm, the probe pressure is adjustable, the minimum pressure is 1g, the pressure stability is within ±0.1g, the probe is installed with the function of definable position

     


    • Supports wafer position identification and automatic adjustment
    • The test platform is made of high thermal conductivity material, TEC temperature range is 25~85°C
    • Supports fast spectrum testing

    • Software supports accurate positioning map, coordinate data generation, database automatically store data and pictures

     

  • Parameters

    Description/Value

    Suitable Wafer size

    2 inches、4 inches and 6 inches

    Chip power-on mode

    Support the same and different face type of VCSEL power-up

    Current range

    0-500mA

    Current output and measurement accuracy

    0~20mA:0.1%FS±0.1mA

    0~100mA:0.1%FS±0.1mA

    0~250mA:0.1%FS±0.25mA

    0~500mA:0.1%FS±0.5mA

    Current power-on mode

    Support continuous current scanning, and pulse power-on: pulse width 200us~650ms, period 2ms~6s, synchronous output trigger signal

    Optical power

    range : 0-500mW,accuracy : 0.1%FS±50uW

    Forward voltage

    range : 0-5V,accuracy : 0.5%±50mV

    Wavelength range

    800-1700 nm,other wavelength support customization

    Temperature control range

    25~85℃,stability<±1℃

    Equipment size

    1120*1180*1650mm(L×W×H)

    Air supply requirements

    Positive pressure: None; Negative pressure:≦-80KPa

    Power supply

    AC 220V/16A 50Hz