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DC Pulse 2-in-1 Wafer Tester

Classification:


Precise high-power VCSEL tester is used for Wafer testing of surface-emitting VCSEL, supports the testing of chip LIV, spectrum, near-field, and far-field related parameters, automatic visual recognition, and fully automatic testing of each chip; support Normal temperature, high temperature dual temperature test, high temperature test temperature can be set by the user. Compatible with a variety of different sizes of Wafer, and open the measurement database to users for subsequent screening processes.


  • Application
  • Characteristic
  • Specifications
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    • Commodity name: DC Pulse 2-in-1 Wafer Tester
    • 型号: PSS WT-201
    • Describe: 100us pulse test, compatible with DC and Pulse power-on

    Precise high-power VCSEL tester is used for Wafer testing of surface-emitting VCSEL, supports the testing of chip LIV, spectrum, near-field, and far-field related parameters, automatic visual recognition, and fully automatic testing of each chip; support Normal temperature, high temperature dual temperature test, high temperature test temperature can be set by the user. Compatible with a variety of different sizes of Wafer, and open the measurement database to users for subsequent screening processes.

    Product Application

    • Typical VCSEL chip tests for applications such as face recognition and automotive radar.
    • Verification test of high-power. surface-emitting chips.

     

  • Product Features

    • Integrate self-made ultra-narrow pulse SMU, minimum pulse to 1us, maximum current 30A

     


    • The integrating sphere collects light synchronously, supporting short pulse LIV test and spectral test.

     

     

    • Support wafer position recognition and automatic adjustment.
    • The test platform is made of high thermal conductivity material, TEC temperature control, the temperature range can support 15~100°C.
    • Support four-wire voltage test, eliminating the impact of environmental line loss on chip voltage test results.
    • Support fast spectrum test.
    • Support NF uniformity and bad point detection.

     

     

    • Support FF test divergence angle test.

     

     

    • The software supports the generation of precise positioning maps and coordinate data, and the database automatically stores data and pictures.

     

     

    • The low-sensitivity high-current probe developed technology supports narrow pulse high-current testing.

     

  • Parameter

    Description/Value

    Test type

    supports same-plane and different-plane designed VCSEL

    LIV main parameters

    Ith 、P、Vf、Rs、SE、PCE,Spectral parameters, etc.

    Pulse power up

    0-30A

    DC power up

    0-3A

    Voltage measurement

    0-10V

    Near field test

    support

    Far field test

    support

    Temperature control

    15~100℃

    Wavelength range

    Support customization

    Power supply

    AC 220V 50Hz