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COC tester

Classification:


PSS COCT2000 Test Machine supports LIV comprehensive testing and spectral testing of COC devices (DFB/EML/Tunable supported) at room temperature and high temperature. It can be used in conjunction with PSS COC burn-in system to screen out defective products by comparing test data before and after burn-in. The test machine has the characteristics of high integration, high efficiency and high stability.


  • Application
  • Characteristic
  • Specifications
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    • Commodity name: COC tester
    • 型号: PSS COCT2000
    • Describe:

    PSS COCT2000 Test Machine supports LIV comprehensive testing and spectral testing of COC devices (DFB/EML/Tunable supported) at room temperature and high temperature. It can be used in conjunction with PSS COC burn-in system to screen out defective products by comparing test data before and after burn-in. The test machine has the characteristics of high integration, high efficiency and high stability.

    Product Application

    • COC LIV comprehensive test  
    • COC OSA test 
    • LD Chip reliability verification  
    • LD Chip failure analysis

     

     

  • Product Features 

    • The system uses an automatic motion control system to drive the test probe to test devices with different hole positions;  
    • For LIV test, it adopts integrating sphere light collection test, which has a large light collection range and high repeatability;       
    • For OSA test, it uses a combination of collimating lens and multimode fiber to collect light, and automatic coupling algorithm for coupling;     
    • Adopt TEC for temperature control, to ensure stable temperature and fast heating and cooling speed;   
    • The software can support a variety of spectrometers, and can be customized;

     


    • Reliable power-on EOS protection;

     

     


    • Good repeatability test consistency.

     

    Reposition the fixture and repeat the test for the same chip several times. The consistency results are: Ith change < 0.8% , Po change < 0.5%.
    Excellent repeatability can greatly reduce the misjudgment rate under COC burn-in test conditions, further improve the yield rate of manufacturers, and reduce production costs.

  • Testing host Parameters

    Index

    Electrical performance parameters

    LD drive current

    0~500mA

     

    LD drive current detection

    0~500mA

     

    LD voltage

    0~5V

     

    EA voltage range

    -5V~0V

     

    EA current

    0~250mA

     

    Drive mode

    CW/PW

     

    Support wavelength range

    1000nm~1600nm

    Temperature control parameters

    Temperature range

    15°C~100°C

     

    Heating rate

    Typical value: 6°C/Min

     

    Cooling rate

    Typical value: 5°C/Min

     

    Temperature stability

    Typical value: ±0.3°C

     

    Temperature Uniformity

    Typical value: ±1°C

    Upper computer

    Sharing

    Shared dll

     

    Database

    The system comes with own SQL database, also supports remote database and MES system.

    Single test time

    LIV comprehensive test

    1.5S

     

    Spectrum test

    2S, typical value (single point test spectrum)

    Installation Requirements

    Index

    Remarks

    System power supply

    AC 220V 50HZ

    Two-phase three-wire system

    Testing host rated power

    0.5KW

     

    Working environment temperature

    25℃±2℃

     

    Host space

    4㎡