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Reliability Test
Key words:
PSS COCBI burn-in system is a high-power COC burn-in system, which supports high-current, narrow pulse power-on burn-in, and is used for long-term reliability tests of COC chips under high temperature and stable current conditions. The system supports front optical power detection, the software monitors the data of the burn-in process in real time, and supports users to perform life analysis and burn-in screening of chips; The whole machine adopts drawer layout, supporting up to 10 floors and 40 burn-in drawers. Users can configure the number of layers of the burn-in box according to their specific burn-in scale requirements.
Key words:
LD integrated reliability system is used for burn-in screening and reliability life analysis of various types of packaged LD devices. The system can define and provide up to 500mA drive current and 150°C high-temperature burn-in conditions through software configuration pins. At the same time, it can monitor and test the drive current, backlight current and threshold of the device in real time, and automatically judge product failure. Real-time storage of monitoring data to support data retrieval of aging and failed devices. Support single burn-in of up to 3072pcs.
Key words:
PSS EML TO integrated burn-in test system is used for burn-in screening and reliability life analysis of EML TO devices. The system supports a maximum of 1536 device burn-in, by controlling the temperature of the external environment or the high temperature of the TEC inside the device，it provides constant current for LD devices to achieve burn-in of EML devices. The system can display the burn-in current, backlight current, forward voltage， EA current etc parameters in real time and the graphics are intuitively displayed, which is convenient for observing abnormal conditions in the burn-in process. The general burn-in board is compatible with our EML TO disk test system, which significantly improves the test efficiency and the quality of TO products.
Key words:
LD Desktop Burn-in Power Supply
PSS LD desktop aging monitoring power supply (PSS ATLD-VI) is used for burn-in screening and reliability life analysis of LD devices. After screening, the quality of TO products can be effectively improved. A single system can support the burn-in of 64 devices. The burn-in of the device can be realized by providing a constant current to the LD device. The system can display the burn-in current, backlight current, forward voltage and other parameters in real time, and the graphics can be displayed intuitively, which is convenient for observing the abnormal situations in the burn-in process, the universal burn-in board is compatible with other automation equipment of our company.
Key words:
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