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VCSEL Wafer Testing

VCSEL wafer tester, covering wafer testing in optical communication, consumer electronics, and LiDAR applications. Supports 2, 4, and 6-inch wafers, highly compatible, and offers comprehensive testing functions including LIV, spectrum, near/far-field divergence angle, polarization, etc. High testing efficiency.
VCSEL Wafer Testing
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Data communication VCSEL wafer testing

Data communication VCSEL wafer testing

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PSS WT-8501

The Phasis Photonics VCSEL tester is used for wafer testing of surface-emitting VCSELs. It supports testing of chip LIV and spectral parameters, visual auto-recognition, and fully automated testing of each chip; it supports both room temperature and high-temperature testing, with the high-temperature test temperature customizable by the user. It is compatible with various wafer sizes, and provides users with an open measurement database for subsequent sorting processes.

The Prases Photonics VCSEL tester is used for wafer testing of 850nm VCSELs for surface light communication. It supports testing of chip LIV and spectral parameters, visual automatic identification, and fully automatic completion of testing for each chip; it supports room temperature and high-temperature testing, with the high-temperature testing temperature customizable by the user. It is compatible with various wafer sizes and provides users with an open measurement database for subsequent screening processes.

DC pulse two-in-one wafer tester

DC pulse two-in-one wafer tester

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PSS WT-201

The Prases high-power VCSEL tester is used for wafer testing of surface-emitting VCSELs. It supports testing of chip parameters such as LIV, spectrum, near-field, and far-field. It features visual auto-recognition and fully automates testing of each chip; supports both room temperature and high-temperature testing, with the high-temperature test temperature customizable by the user. It is compatible with various wafer sizes and provides users with an open measurement database for subsequent sorting processes.

100us pulse test, compatible with DC and pulse power supply

VCSEL wafer testing for LiDAR

VCSEL wafer testing for LiDAR

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PSS WT-VL602

The Prases high-power VCSEL tester is used for wafer testing of vertical-cavity surface-emitting laser chips. It supports LIV, spectrum, near-field, and far-field parameter testing with pulse widths as short as 100ns and currents up to 30A. It features visual auto-recognition and fully automated testing of each chip; Chuck temperature testing from 25℃ to 85℃ is supported. Standard configuration includes 6-inch wafer testing, compatible with 2-inch and 4-inch wafers and chip testing. A measurement database is provided to users for subsequent sorting processes.

The PreciTest narrow pulse wafer tester is used for wafer testing of VCSEL laser chips for LiDAR. It supports the testing of LIV, spectrum, near-field, and far-field related parameters with pulse widths as short as 100ns and currents up to 30A. It features visual auto-recognition and fully automated testing of each chip; chuck temperature settings from 25℃ to 125℃ are supported. Standard configuration is for 6-inch wafers, but it's compatible with 2-inch and 4-inch wafers and fragments. Measurement databases are made available to the user for subsequent sorting processes.

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