Products

VCSEL Wafer Tester

VCSEL wafer tester covering wafer testing in optical communication, consumer electronics, lidar and other application fields, supports 2, 4, and 6-inch wafers, strong compatibility, comprehensive testing functions, including LIV, spectrum, near/far field divergence Angle, polarization and other test items, with high test efficiency.
VCSEL Wafer Tester
850nm Optical Wafer Tester

PSS WT-8501

850nm Optical Wafer Tester

DC 15mA high precision test

PSS optical communication VCSEL testing machine is used for Wafer testing of surface emission type VCSEL, supporting the testing of LIV and spectral related parameters of the chip, visual automatic recognition, and fully automatic testing of each chip, and room temperature, high temperature and double temperature test, and the temperature can be customized by the user. Compatible with a variety of different sizes of wafers, open the measurement database to the user for subsequent screening division sequence.

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DC Pulse 2-in-1 Wafer Tester

PSS WT-201

DC Pulse 2-in-1 Wafer Tester

100us pulse test, compatible with DC and Pulse power-on

Precise high-power VCSEL tester is used for Wafer testing of surface-emitting VCSEL, supports the testing of chip LIV, spectrum, near-field, and far-field related parameters, automatic visual recognition, and fully automatic testing of each chip; support Normal temperature, high temperature dual temperature test, high temperature test temperature can be set by the user. Compatible with a variety of different sizes of Wafer, and open the measurement database to users for subsequent screening processes.

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Narrow Pulse LiDAR Wafer Tester

PSS WT-VL602

Narrow Pulse LiDAR Wafer Tester

100ns narrow pulse test

PSS high power VCSEL tester is used for Wafer testing of vertical cavity surface emission laser chips, supporting the testing of LIV, spectrum, near field and far field parameters with 100ns level pulse width up to 30A current, visual automatic recognition, and fully automatic testing of each chip. Chuck can test the temperature between 25 ° C and 85 ° C. Standard 6inch Wafer test, compatible with 2, 4inch wafers and broken wafers testing, open measurement database to users for subsequent screening process.

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