Products

Chip Testing

The PSS optical chip tester covers wafer, BAR, chip, and COC chip testing needs. As a fully automated testing system, it integrates mechanical movement, chip testing and measurement, chip temperature platform, data computation, processing, and display functions, providing a complete chip testing solution with high efficiency and cost advantages.
Chip Testing
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Data Communication Single-station Bar Tester

Data Communication Single-station Bar Tester

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PSS BAR-HT2101

PSS EML BAR automatic tester is used for LD bar LIV curve, spectrum, backlight automatic measurement, EA power-on test, SOA power-on test. Fully automatic loading and unloading supports loading of various specifications of material boxes and unloading of various specifications of material boxes or blue film. The dual temperature test (normal/high temperature) is available. High temperature test temperature can be customized by the user. The measurement database is open to users for subsequent screening processes.

Data communication bar single-station test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Data Communication Dual-station Bar Tester

Data Communication Dual-station Bar Tester

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PSS BAR-HT2201

PSS dual-station normal/high temperature BAR automatic tester (PSS BAR-HT2201) is used for normal/high temperature testing of bars such as DFB/EML, supporting optoelectronic characteristics testing such as LIV, spectrum, divergence angle and polarization. It supports fully automatic loading and unloading, non-sticky material box loading and Disco blue film ring unloading. Dual test system and dual stage are available, and the temperature can be customized by the user: 20~90℃. The measurement data is open to users for subsequent screening processes. This data communication dual-station bar tester has complete functions with strong compatibility.

Data communication bar dual-station test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Visible Laser Bar Tester

Visible Laser Bar Tester

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PSS BART-HP

The visible laser BAR automatic tester is used for automatic measurement of bar LIV curve, spectrum, and far field. Fully automatic loading and unloading supports loading of material box and unloading of material box or blue film. The dual temperature test (normal/high temperature) is available. The test temperature can be customized by the user. The probe is powered on, and the tested NG chip is marked with dots. The measurement database is opened to the user for subsequent screening processes.

Visible laser bar single-station test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Data Communication Dual-station Chip Tester

Data Communication Dual-station Chip Tester

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PSS CHIP22406

This equipment is used for high/normal temperature LIV testing, SMSR testing and backlight sampling of optical chips LD-CHIP, and classifies and screens different test results. The chip wafer is loaded with blue film, and the CHIP-ID is automatically identified and tested via memory-matching. Chips are peeled off by a blue film ejector, sucked by a nozzle, and transported by a manipulator to the high/normal temperature test areas respectively for automatical positioning, testing, analyzing screening and manipulator transporting and classification. This equipment has the characteristics of high speed and high accuracy, and realizes a process with complex timing and strict logic. The equipment adopts eccentric cam drive, connecting rod and precision fixture, and cooperates with multi-axis motion, visual positioning and visual character matching, and has mass production capabilities.

Data communication chip dual-station test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Visible Laser Chip Tester

Visible Laser Chip Tester

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PSS CHIP12806-P

This equipment is used for visible laser CHIP normal temperature PIV test and spectrum test and classifies and screens different test results. Chip blue film loading, automatic material search, identification and positioning are available. Chips are peeled off by a blue film ejector, sucked by a nozzle, and transported by a manipulator for visual recognition and position calibration and automatic power-on to collect luminous parameters, test PIV/spectrum, analysis and screening, manipulator transportation and classification to different blue film ranges. This equipment has the characteristics of high speed and high accuracy, and realizes complex timing and strict logic process. The equipment uses linear motors, high-accuracy module motion and cams, combined with technologies such as multi-axis motion, visual positioning and ORC recognition, having mass production capabilities.

Visible laser chip single-station test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

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