Visible Laser Bar Tester-Module testing_TO testing

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Visible Laser Bar Tester

Classification:

The visible laser BAR automatic tester is used for automatic measurement of bar LIV curve, spectrum, and far field. Fully automatic loading and unloading supports loading of material box and unloading of material box or blue film. The dual temperature test (normal/high temperature) is available. The test temperature can be customized by the user. The probe is powered on, and the tested NG chip is marked with dots. The measurement database is opened to the user for subsequent screening processes.

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- Commodity name: Visible Laser Bar Tester
- 型号: PSS BART-HP
- Describe: Visible laser bar single-station test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle
The visible laser BAR automatic tester is used for automatic measurement of bar LIV curve, spectrum, and far field. Fully automatic loading and unloading supports loading of material box and unloading of material box or blue film. The dual temperature test (normal/high temperature) is available. The test temperature can be customized by the user. The probe is powered on, and the tested NG chip is marked with dots. The measurement database is opened to the user for subsequent screening processes.

Application
The equipment is used for automatic testing of visible laser BAR. The spectrum and LIV parameter testing of edge emitting lasers under normal/high temperature conditions can be realized

Features
1. Support a variety of mainstream specifications of material boxes, fully automatic loading and unloading, avoiding the scrapping of bar chips caused by material transfer or manual operation

2. The loading & unloading material boxes are equipped with magnetic suction fixtures, supporting the rapid replacement of material boxes or blue film disks of different specifications
3. Support automatic loading of BAR, identification and positioning of the first chip, ID identification, automatic testing, automatic judgment of the completion of BAR testing and automatic unloading

4. The contact pressure between the nozzle, probe and BAR is adjustable
5. Support single probe, double probe, and multi-probe power-on forms

6. Support frontlight LIV curve, power, spectrum measurement, backlight power measurement, multi-parameter and multi-condition screening to screen out bad chips as much as possible to avoid flowing into the back-end process
7. Support MAP drawing to facilitate users to analyze the performance distribution of wafers

8. Support NG Chip dot marking and simple chip appearance inspection
9. Support normal/high temperature testing, normal temperature bench supporting temperature control
10. Multi-dimensional adjustable measurement structure meets users' measurement needs for bars of different specifications

Specification