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Chip Reliability

Chip Reliability
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High-Power Drawer COC Burn-in System

High-Power Drawer COC Burn-in System

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PSS LRS23841

The PSS High-Power Drawer-Type COC Burn-in System (PSS LRS23841), commonly used for burn-in screening and lifetime reliability analysis of high-power DFB, EML and EML-SOA chips. The system supports synchronous output of constant current (LD & SOA) and constant voltage (EA). It real-time monitors parameters such as current, voltage, optical power and temperature, and performs automatic failure judgment for devices. It supports local and remote databases, enabling data analysis and traceability of failed components.

Adopt TEC + water cooling temperature control, single-channel current ≤1000mA, voltage ≤5V; Support 40 temperature control units, with a maximum capacity for simultaneous burn-in of 3840 PCS of COCs

COC Drawer-type Burn-in System

COC Drawer-type Burn-in System

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PSS COCBI13841

PSS COCBI Burn-in System is a high-power COC burn-in system that supports high-current, narrow-pulse power-on burn-in. It is used for long-term reliability experiments of COC chips under high temperature and stable current conditions. It supports front-light power detection, software monitoring the burn-in process data in real time and users to perform life analysis and burn-in screening on chips. The whole machine adopts a drawer-type layout, supporting up to 10 layers and 40 burn-in drawers, and the number of layers of the burn-in box can be configured according to the specific burn-in scale requirements.

Single-channel current ≤500mA; voltage ≤5V; supporting 40 temperature control units, simultaneous burn-in of up to 3840PCS COCs

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