Automated Test Equipment-Product-Module testing_TO testing_WUHAN PSS ELECTRONICS CO., LTD

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Automated Test Equipment

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VCSEL Wafer Testing

VCSEL Wafer Testing

Chip Testing

Optical Device Testing

Optical Device Testing

Optical Engine Testing

Optical Engine Testing

Data Communication COC Tester

Data Communication COC Tester

PSS COC3T19201

DFB and EML laser chip testing for COC packaging, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Data Communication TO Tri-temperature Tester

Data Communication TO Tri-temperature Tester

PSS LDTO3T8002

DFB or EML TO industrial tri-temperature test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Data Communication TO46 Disk Tester

Data Communication TO46 Disk Tester

PSS PAT-46-I(E)

APDTIA/PINTIA TO test, supporting tests of optoelectronic characteristics such as breakdown voltage, responsivity and dark current

Data Communication TO56/EML TO Disk Tester

Data Communication TO56/EML TO Disk Tester

PSS PAT5606

DFB or EML TO test, supporting tests of optoelectronic characteristics such as LIV and spectrum

LiDAR VCSEL COB Tester

LiDAR VCSEL COB Tester

PSS PLST1602

LiDAR VCSEL COB narrow pulse test, supporting tests of related parameters such as LIV, spectrum, NF and FF

LiDAR TO Tester

LiDAR TO Tester

PSS PLST401

LiDAR VCSEL TO narrow pulse test, supporting tests of related parameters such as LIV, spectrum, NF and FF

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086-27-8990 8766

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027-8990 8766

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Module testing

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0862789908766

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