Products

Automated Test Equipment

Automated Test Equipment
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Data communication TO three-temperature test machine

Data communication TO three-temperature test machine

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PSS LDTO3T8002

Industrial-grade three-temperature performance testing applicable to TO56 and EML TO, including LIV and spectral performance testing, with a single test capacity of 160 pcs

Visible light automatic loading and unloading test machine

Visible light automatic loading and unloading test machine

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PSS TTP3302

Automated loading and unloading testing and binning for visible light TO56 and TO9, supporting LIV, spectral, divergence angle, and polarization extinction ratio testing, DC 5A@10V, Pulse testing 20A@30V.

Visible light TOF sensor

Visible light TOF sensor

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PSS PAT902-RGB

Suitable for high-power TO9 packages, supports integrated testing and temperature control, supports DC 10A@20V, Pulse testing 30A@20V, supports PIV and spectrum, divergence angle testing, and is compatible with aging equipment and aging boards to avoid material transfer.

LiDAR TO test machine

LiDAR TO test machine

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PSS PLST401

Supports high-temperature performance testing of lidar TO-packaged chips under 100ns pulse conditions, supporting LIV and spectral testing, near-field testing and far-field testing

LiDAR VCSEL COB Tester

LiDAR VCSEL COB Tester

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PSS PLST1602

Supports high-temperature performance testing of laser radar COB packaged chips under 10ns pulse conditions, supports optical power and spectral testing, and supports near-field and far-field testing

Data communication TO56/EML TO tray tester

Data communication TO56/EML TO tray tester

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PSS PAT5606

Suitable for optoelectronic performance testing of DFB/EML TO56, including LIV/spectrum, ACR, etc., and shares test fixture with integrated aging chamber.

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