Products

Automated Test Equipment

Automated Test Equipment
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COS Automatic Test System

COS Automatic Test System

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PSS COST22401

PSS COS Automatic Test System (PSS COST22401) supports comprehensive LIV testing and spectral testing at room/high temperature for CW-DFB laser chips in COS package form. It supports us-level DC/pulse output and measurement. The system adopts dual-station testing with fully automatic robotic loading and unloading. It features high integration, high efficiency, high stability, and simple maintenance and operation.

Applicable for testing high-power DFB laser chips for COS packaging; with automatic loading and unloading, supporting LIV and spectral characteristic testing

LiNbO3 Automatic Test System

LiNbO3 Automatic Test System

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PSS CHIP LiNbO3

PSS Normal/High-Temperature Thin-film Lithium Niobate Automatic Tester (PSS CHIP-LiNbO₃) is applied to the coupling test of lithium niobate (LiNbO₃) chips, supporting the testing of optoelectronic characteristics including thermal resistance, thermal tuning power, half-wave voltage and spectrum. Adopting a single load platform per test system, the platform temperature control range is 25~85℃. It features fully automatic loading and unloading. Measurement data is open to users for subsequent sorting processes.

Integrate comprehensive test functions, supporting thermal resistance, thermal tuning power, extinction ratio, minimum insertion loss, half-wave voltage, optical spectrum testing, and OCR recognition of chip codes

Data Communication COC Tester

Data Communication COC Tester

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PSS COC3T19201

PSS COCT2000 supports LIV comprehensive test and spectrum test of COC devices (supporting DFB/EML/Tunable) at normal/high temperature. Used in conjunction with our COC burn-in system, it can screen out defective products by comparing the test before and after burn-in. It has the characteristics of high integration, high efficiency and high stability.

DFB and EML laser chip testing for COC packaging, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Data Communication TO Tri-temperature Tester

Data Communication TO Tri-temperature Tester

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PSS LDTO3T8002

PSS TO three-temperature test system supports industrial-grade low/normal/high temperature tests for TOs. The temperature control range is -40°C to 85°C. It is applicable for automatic testing of VCSEL/FP/DFB-TOCAN, supporting device any pin packaging tests, LIV characteristic tests and spectrum tests. The system supports two fixtures for testing at a time, and each fixture can load 128 TOs, which improves test output. The system has the characteristics of fast temperature control, good temperature uniformity, good stability and reliability and high test efficiency.

DFB or EML TO industrial tri-temperature test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Data Communication TO46 Disk Tester

Data Communication TO46 Disk Tester

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PSS PAT-46-I(E)

In order to improve the reliability of optical devices, optical devices will undergo performance testing before TO packaging to prevent defective devices from flowing into the next production process to cause losses in manpower and material resources. Wuhan PSS TO-46 automatic test system is mainly used to automatically test the performance characteristics such as breakdown voltage, dark current, working current, responsiveness and D+/D- of 64 devices, with the characteristics of high integration, high speed and high stability.

APDTIA/PINTIA TO test, supporting tests of optoelectronic characteristics such as breakdown voltage, responsivity and dark current

Data Communication TO56/EML TO Disk Tester

Data Communication TO56/EML TO Disk Tester

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PSS PAT5606

PSS TO56 automatic disk test system is applicable for automatic testing of VCSEL/FP/DFB/DML/EML/SOA-EML-TOCAN. It uses one test board to test 64 4PIN/5PIN FP/DFB TOs or 32 7PIN/8PIN DML/EML TOs. It supports any pin package testing, high temperature testing, TEC temperature control, LIV characteristic testing and spectrum testing. This system is used in conjunction with our burn-in box to improve factory production and testing efficiency. It has the characteristics of high integration, high speed and high stability.

DFB or EML TO test, supporting tests of optoelectronic characteristics such as LIV and spectrum

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