Data Communication TO46 Disk Tester-Module testing_TO testing

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Data Communication TO46 Disk Tester

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In order to improve the reliability of optical devices, optical devices will undergo performance testing before TO packaging to prevent defective devices from flowing into the next production process to cause losses in manpower and material resources. Wuhan PSS TO-46 automatic test system is mainly used to automatically test the performance characteristics such as breakdown voltage, dark current, working current, responsiveness and D+/D- of 64 devices, with the characteristics of high integration, high speed and high stability.

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- Commodity name: Data Communication TO46 Disk Tester
- 型号: PSS PAT-46-I(E)
- Describe: APDTIA/PINTIA TO test, supporting tests of optoelectronic characteristics such as breakdown voltage, responsivity and dark current
In order to improve the reliability of optical devices, optical devices will undergo performance testing before TO packaging to prevent defective devices from flowing into the next production process to cause losses in manpower and material resources. Wuhan PSS TO-46 automatic test system is mainly used to automatically test the performance characteristics such as breakdown voltage, dark current, working current, responsiveness and D+/D- of 64 devices, with the characteristics of high integration, high speed and high stability.

Application
1. PIN-TIA (Vpd/Mon)/APD-TIA TO performance test
2. TO46 focal length spot check test

Features
1. Compatible with PSS burn-in board, completing TO burn-in and testing in one stop
2. Support comparison before and after burn-in, compare various test parameters, convenient for failure analysis
3. Have focal length test function
4. Support any pin switching (except GND pin), realize one connection method, multiple package tests

5. Support external light source QSFP, SFP module interface, realize any wavelength test
6. Desktop equipment, small occupancy area
7. Software operated easily, with counting and classification functions, convenient for batch test analysis

Specification