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Optical Device Reliability

Optical Device Reliability
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EML desktop aging monitoring power supply

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PSS ATEML-3201

LD integrated aging system

LD integrated aging system

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PSS LDBI13003

LD integrated aging system, used for aging screening and reliability life analysis of various types of packaged LD devices. The system can configure pin definitions through software and provide a drive current of up to 500mA and high-temperature aging conditions of 150℃. It also performs real-time monitoring and testing of the device's drive current, backlight current, and threshold, and automatically judges product failures. Real-time storage of monitoring data supports data tracing of aged and failed devices. Supports a maximum of 3072 devices for single aging run.

Supports DML TO aging, up to 3072 channels

EML integrated aging system

EML integrated aging system

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PSS EMLBI21536

The Prases EML TO Integrated Aging Test System is used for aging screening and reliability life analysis of EML TO devices. The system supports aging of up to 1536 devices. It uses external environmental temperature control or high-temperature control of the internal TEC of the device, providing a constant current to the LD device to achieve aging of the EML device. The system can display in real time parameters such as aging current, backlight current, forward voltage, and EA current, and displays them graphically for intuitive observation, facilitating the observation of abnormal situations during the aging process. The universal aging board is compatible with our company's EML TO tray testing system, significantly improving testing efficiency and TO product quality.

Support EML TO aging, up to 1536 channels

LD desktop aging monitoring power supply

LD desktop aging monitoring power supply

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PSS ATLD-VI

The hardware supports two current ranges: low current and high current, perfectly compatible with VECSEL and FP/DFB lasers. The 64-channel aging board serves as a universal carrier, enabling the transfer of materials between different testing and aging stations, thus improving production efficiency.

Single unit supports 64 channels, multiple units can be cascaded

APD integrated aging system

APD integrated aging system

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PSS APDBI13002

The APD integrated aging system is used for reliability assessment and aging screening of APD, APD-TIA, PIN, and PIN-TIA TO devices in the optical communication industry, supporting up to 3072 devices simultaneously. The system can provide constant current of 2mA, constant voltage of 5V, and high-temperature aging conditions of 175℃, while simultaneously monitoring the device's VBR and TIA current in real time and automatically judging product failure. Real-time storage of monitoring data supports traceability of aged and failed devices, effectively improving the efficiency and reliability of TO production and significantly increasing device testing output and quality.

Supports APD TO aging, up to 3072 channels

APD desktop aging monitoring power supply

APD desktop aging monitoring power supply

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PSS APDBI-IV

The PUSS APD desktop aging monitoring power supply (PSS APDBI-IV) is used for aging APD, APD-TIA, PIN, PIN-TIA TO devices, improving the quality of the devices. This system achieves device aging by providing constant current to APD, reverse bias to PIN, and constant voltage to TIA. Coupled with an independently supplied aging chamber, it can control the device's operating environment temperature, achieving high-temperature aging. During the aging process, the TIA operating current and APD voltage of the device are monitored and tested in real time, and the test data is recorded. Failed devices can be traced. A single unit can independently age 64 APD devices.

Single unit supports 64 channels, multiple units can be cascaded

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