EML Integrated Burn-in System
Classification:
PSS EML TO integrated burn-in test system is used for burn-in screening and reliability life analysis of EML TO devices. The system supports burn-in of up to 1536-channel devices. It provides constant current for LD devices through external environmental temperature control or high temperature control of the internal TEC of the device to achieve burn-in of EML devices. The system can display parameters such as burn-in current, backlight current, forward voltage, EA current in real time and display them in graphical form, which is convenient for observing abnormal conditions during burn-in process. The universal burn-in board is compatible with our EML TO disk test system, significantly improving test efficiency and TO product quality.
- Application
- Characteristic
- Specifications
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Application
1. Burn-in screening of EML TO devices in mass production
2. Long-term reliability failure test analysisFeatures
1. Hardware supports SOA power supply, perfectly compatible with EML lasers with PD or SOA
2. Support Im sweep to calculate Ith
3. Each burn-in board can be configured with different parameters for burn-in
4. The burn-in board supports online recording function
5. Complete EOS protection to ensure the safety of the device during burn-in
6. High density, low power consumption
7. Support hot-swap protection
8. Monitor and record the number of plug-in and plug-out times of the burn-in board
9. Monitor and record equipment operation status
10. Burn-in chamber 150℃ high temperature environment burn-in (PSS EMLBI21536)Specification

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1. Hardware supports SOA power supply, perfectly compatible with EML lasers with PD or SOA
2. Supports Im scan calculation Ith
3. Each aging board can be configured with different parameters for aging
4. The aging board supports online recording function
5. Complete EOS protection to ensure the safety of devices during aging
6. High density, low power consumption
7. Supports hot-swap protection
8. Aging board plug-in times monitoring and recording
9. Device operating status monitoring and recording
10. Aging chamber 150℃ high temperature environment aging (PSS EMLBI21536) -

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