APD Integrated Burn-in system-Module testing_TO testing

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APD Integrated Burn-in system

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APD Integrated Burn-in System is used for reliability evaluation and burn-in screening of TO devices such as APD, APD-TIA, PIN and PIN-TIA in optical communication industry. It can support up to 3072pcs single burn-in. The system can provide 2mA constant current, 5V constant voltage, and 175℃ high temperature burn-in conditions, while monitoring the VBR and TIA current of the device in real time, and automatically judge product failure. Real-time storage of monitoring data and support for tracing of burn-in failure devices can effectively improve the efficiency and reliability of TO production, and also greatly improve the output and quality of device testing.

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- Commodity name: APD Integrated Burn-in system
- 型号: PSS APDBI13002
- Describe: APD constant current ≤2mA, APD voltage measurement 0~70V, TIA constant voltage ≤5V, VPD voltage ≤20V, PD current measurement 200uA, up to 3072PCS single burn-in
APD Integrated Burn-in System is used for reliability evaluation and burn-in screening of TO devices such as APD, APD-TIA, PIN and PIN-TIA in optical communication industry. It can support up to 3072pcs single burn-in. The system can provide 2mA constant current, 5V constant voltage, and 175℃ high temperature burn-in conditions, while monitoring the VBR and TIA current of the device in real time, and automatically judge product failure. Real-time storage of monitoring data and support for tracing of burn-in failure devices can effectively improve the efficiency and reliability of TO production, and also greatly improve the output and quality of device testing.

Application

1. Burn-in and screening of APD, APD-TIA, PIN, and PIN-TIA TO devices during mass production
2. Long-term reliability failure test analysis

Features

1. Provide completely independent drive current for each channel
2. APD circuit has the function of voltage limiting protection to prevent the device from being damaged by constant current open circuit and high voltage output
3. Reliable EOS protection, the power-up sequence is APD after TIA, and the power-down sequence is TIA after APD. Time delay can be configured to ensure the safety of power-on and power-off of the device
4. As a general carrier, the 64-channel burn-in board can realize the direct transfer of materials at different stations of disk testing, burn-in and sorting, and improve the production efficiency

Specifications
1. Provides completely independent drive current for each channel;
2. The APD circuit has overvoltage protection to prevent damage to the device from high voltage output when the constant current is open;
3. Reliable EOS protection, power-on sequence: TIA powers on first, then APD powers on; power-off sequence: APD powers off first, then TIA powers off. The time delay can be configured to ensure safe power-on and power-off of the device;
4. The 64-channel aging board serves as a general-purpose carrier, enabling direct material transfer between different workstations for testing, aging, and sorting, thus improving production efficiency;