Products

Chip Tester

Chip tester covering chip testing in consumer electronics such as optical communication, visable light etc., lidar and other application fields, supports various types of chips, including optical DFB/EML/SOA-EML, etc., and tests under various high current and narrow pulse conditions , with comprehensive test functions, including LIV, spectrum, divergence angle, polarization and other test items, also with high test efficiency;
Chip Tester
Single temperature carrier (single needle) chip tester

PSS CHIP11405-P series

Single temperature carrier (single needle) chip tester

Compatible with DC, Pulse power-up

This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.

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Dual temperature stage (single needle) chip tester

PSS CHIP22404-P series

Dual temperature stage (single needle) chip tester

Compatible with DC, Pulse power-up

This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.

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Optional divergence angle test

PSS CHIP11405-P series

Optional divergence angle test

Compatible with DC, Pulse power-up

This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.

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DFB (single needle) chip tester

PSS CHIP22405 series

DFB (single needle) chip tester

Compatible with DC, Pulse power-up

This equipment is used in optical chip LD-CHIP high temperature/normal temperature LIV test, SMSR test and backlight sampling test, and different test results are classified and screened. Chip wafer blue film loading, CHIP-ID automatic recognition memory matching test, through the blue film thimble peeling mechanism, nozzle suction, manipulator respectively transported to high temperature and normal temperature test area, automatic positioning, automatic testing, analysis and screening, manipulator handling and classification. This equipment has the characteristics of high speed and high precision, and realizes the process of complex timing and strict logic. The equipment adopts eccentric cam drive, connecting rod and precision fixture and other mechanisms, with multi-axis motion, visual positioning, visual character matching and other technologies, with mass production capabilities.

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DFB+EML (double needles) chip tester

PSS CHIP22405 series

DFB+EML (double needles) chip tester

Compatible with DC, Pulse power-up

This equipment is used in optical chip LD-CHIP high temperature/normal temperature LIV test, SMSR test and backlight sampling test, and different test results are classified and screened. Chip wafer blue film loading, CHIP-ID automatic recognition memory matching test, through the blue film thimble peeling mechanism, nozzle suction, manipulator respectively transported to high temperature and normal temperature test area, automatic positioning, automatic testing, analysis and screening, manipulator handling and classification. This equipment has the characteristics of high speed and high precision, and realizes the process of complex timing and strict logic. The equipment adopts eccentric cam drive, connecting rod and precision fixture and other mechanisms, with multi-axis motion, visual positioning, visual character matching and other technologies, with mass production capabilities.

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DFB+EML+SOA (three needles) chip tester

PSS CHIP22405 series

DFB+EML+SOA (three needles) chip tester

Compatible with DC, Pulse power-up

This equipment is used in optical chip LD-CHIP high temperature/normal temperature LIV test, SMSR test and backlight sampling test, and different test results are classified and screened. Chip wafer blue film loading, CHIP-ID automatic recognition memory matching test, through the blue film thimble peeling mechanism, nozzle suction, manipulator respectively transported to high temperature and normal temperature test area, automatic positioning, automatic testing, analysis and screening, manipulator handling and classification. This equipment has the characteristics of high speed and high precision, and realizes the process of complex timing and strict logic. The equipment adopts eccentric cam drive, connecting rod and precision fixture and other mechanisms, with multi-axis motion, visual positioning, visual character matching and other technologies, with mass production capabilities.

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