Products

Optical Chip Test

PSS optical chip tester covers wafer, bar, chip, COC chip testing requirements. It is a fully automatic testing system. The system integrates mechanical movement, chip testing and measurement, chip temperature platform, data calculation processing and display functions. It is a complete set of chip test solution. Solution with high efficiency and cost advantages
Optical Chip Test
Single temperature stage (four needles) bar tester

PSS BarT-HP-ns series

Single temperature stage (four needles) bar tester

100ns narrow pulse test

PSS high-power BAR automatic tester supports high current, ns-level narrow pulse condition testing, fully automatic test BAR LIV curve, spectrum, and far-field parameters. Fully automatic loading and unloading, support loading of various specifications of material boxes, support unloading of various specifications of material boxes or blue film. Support variable temperature test, customers can set the temperature freely. Open measurement database to users for subsequent screening procedures.

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Dual temperature stage (four needles) bar tester

PSS BarT-HP-ns series

Dual temperature stage (four needles) bar tester

100ns narrow pulse test

PSS high-power BAR automatic tester supports high current, ns-level narrow pulse condition testing, fully automatic test BAR LIV curve, spectrum, and far-field parameters. Fully automatic loading and unloading, support loading of various specifications of material boxes, support unloading of various specifications of material boxes or blue film. Support variable temperature test, customers can set the temperature freely. Open measurement database to users for subsequent screening procedures.

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Optional divergence angle test

PSS BarT-HP-ns series

Optional divergence angle test

100ns narrow pulse test

PSS high-power BAR automatic tester supports high current, ns-level narrow pulse condition testing, fully automatic test BAR LIV curve, spectrum, and far-field parameters. Fully automatic loading and unloading, support loading of various specifications of material boxes, support unloading of various specifications of material boxes or blue film. Support variable temperature test, customers can set the temperature freely. Open measurement database to users for subsequent screening procedures.

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Single temperature carrier (single needle) chip tester

PSS CHIP11405-P series

Single temperature carrier (single needle) chip tester

Compatible with DC, Pulse power-up

This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.

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Dual temperature stage (single needle) chip tester

PSS CHIP22404-P series

Dual temperature stage (single needle) chip tester

Compatible with DC, Pulse power-up

This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.

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Optional divergence angle test

PSS CHIP11405-P series

Optional divergence angle test

Compatible with DC, Pulse power-up

This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.

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