Products

BOSA Comprehensive Tester

BOSA comprehensive tester is aimed at the comprehensive test of BOSA devices. The equipment is a test system, including laser LIV test, detector test items, Sen test, OL, crosstalk test, etc. It adopts the way of board card integration, which is convenient for customers to combine and match according to their needs. Replacement of different fixtures can support the testing of ComboPon and other devices.
BOSA Comprehensive Tester
BOSA Comprehensive Test System

PSS BOSA01001

BOSA Comprehensive Test System

With BOSA test fixture

PSS adopts plug-in card combination solution, flexible configuration according to customer needs, and solves the test problems of various OSA devices with complex structures. It can not only realize the rapid test of BOSA devices, but also realize the one-click test of Combo PON devices with complex structures. Support the comprehensive LIV test of DFB and EML TOSA devices in different packages, and also support the test of receiving sensitivity, responsiveness, dark current and other indicators of different rate APD or PINTIA devices. Simulate the actual application environment of the device, and the isolation degree and optical crosstalk test of the internal optical path are carried out to truly reflect the performance of the device.

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ComboPon Device Comprehensive Test System

PSS CPON01001

ComboPon Device Comprehensive Test System

With CPON fixture

PSS adopts plug-in card combination solution, flexible configuration according to customer needs, and solves the test problems of various OSA devices with complex structures. It can not only realize the rapid test of BOSA devices, but also realize the one-click test of Combo PON devices with complex structures. Support the comprehensive LIV test of DFB and EML TOSA devices in different packages, and also support the test of receiving sensitivity, responsiveness, dark current and other indicators of different rate APD or PINTIA devices. Simulate the actual application environment of the device, and the isolation degree and optical crosstalk test of the internal optical path are carried out to truly reflect the performance of the device.

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