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VCSEL Wafer Tester
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Precise high-power VCSEL tester is used for Wafer testing of surface-emitting VCSEL, supports the testing of chip LIV, spectrum, near-field, and far-field related parameters, automatic visual recognition, and fully automatic testing of each chip; support Normal temperature, high temperature dual temperature test, high temperature test temperature can be set by the user. Compatible with a variety of different sizes of Wafer, and open the measurement database to users for subsequent screening processes.
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Narrow Pulse LiDAR Wafer Tester
PSS high power VCSEL tester is used for Wafer testing of vertical cavity surface emission laser chips, supporting the testing of LIV, spectrum, near field and far field parameters with 100ns level pulse width up to 30A current, visual automatic recognition, and fully automatic testing of each chip. Chuck can test the temperature between 25 ° C and 85 ° C. Standard 6inch Wafer test, compatible with 2, 4inch wafers and broken wafers testing, open measurement database to users for subsequent screening process.
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