PRODUCT

• Optical Chip Test

  • VCSEL Wafer Tester

  • BAR Tester

  • Chip Tester

  • COC Tester

• Reliability Test

  • Chip Burn-in

  • Optical communication TO Burn-in

  • Lidar TO Burn-in

  • Visible laser TO Burn-in

  • Burn-in Fittings

• TO Test

  • Optical Communication TO Test

  • Lidar TO Test

  • Visible laser TO Test

• OSA Test

  • Laser Coupling Power Supply

  • LIV Comprehensive Tester

  • Detector Coupling Power Supply

  • BOSA Comprehensive Tester

  • OSA Three-temperature Test

  • OSA Test Accessories

• Module Test

  • BERT

  • Clock Recovery

  • Oscilloscope

  • Extinction Ratio

  • COB Tester

  • Module Three-temperature Test

  • Module Test Board

• General Instruments

  • Source Meter

  • Optical Power Meter

  • Optical Attenuator

  • Optical Switch

  • Light Source

  • Electrical Switch

SOLUTION

• Optical Communication

  • 数据中心

  • 接入网

  • 雷达

• Laser Display

  • TO老化和测试

• Lidar

  • TO老化和窄脉冲测试

• Laser Medical

  • 高功率BAR条测试

SERVICE SUPPORT

• FAQ

• Global Branches

• After-sales Service

• Download Center

NEWS

• Company News

• Industry News

• Exhibition Report

ABOUT US

• Company Profile

• Development History

• Honorary Qualifications

CONTACT US

• Contact Information

• Message