Products

Optical communication TO Burn-in

Optical TO aging includes aging equipment of laser and detector TO packaging type, supports various pin packaging, software supports switching, and is convenient for customers to use; aging system supports temperature control, power-on aging, monitoring aging process data, data analysis and prompts , suitable for long-term aging experiments; the desktop aging power supply has the same function as the aging system, but does not support temperature control, and can be used with the customer's thermostat. It is very convenient for customers to build and integrate
Optical communication TO Burn-in
LD Integrated Burn-in System

PSS LDBI13003

LD Integrated Burn-in System

support DML TO burn-in, up to 3072 channels

LD integrated reliability system is used for burn-in screening and reliability life analysis of various types of packaged LD devices. The system can define and provide up to 500mA drive current and 150°C high-temperature burn-in conditions through software configuration pins. At the same time, it can monitor and test the drive current, backlight current and threshold of the device in real time, and automatically judge product failure. Real-time storage of monitoring data to support data retrieval of aging and failed devices. Support single burn-in of up to 3072pcs.

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EML TO Burn-in Test System

PSS EMLBI11536/21536

EML TO Burn-in Test System

support EML TO burn-in，up to 1536 channels

PSS EML TO integrated burn-in test system is used for burn-in screening and reliability life analysis of EML TO devices. The system supports a maximum of 1536 device burn-in, by controlling the temperature of the external environment or the high temperature of the TEC inside the device，it provides constant current for LD devices to achieve burn-in of EML devices. The system can display the burn-in current, backlight current, forward voltage， EA current etc parameters in real time and the graphics are intuitively displayed, which is convenient for observing abnormal conditions in the burn-in process. The general burn-in board is compatible with our EML TO disk test system, which significantly improves the test efficiency and the quality of TO products.

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LD Desktop Burn-in Power Supply

PSS ATLD-VI

LD Desktop Burn-in Power Supply

A single unit supports 64 channels, and multiple units can be cascaded

PSS LD desktop aging monitoring power supply (PSS ATLD-VI) is used for burn-in screening and reliability life analysis of LD devices. After screening, the quality of TO products can be effectively improved. A single system can support the burn-in of 64 devices. The burn-in of the device can be realized by providing a constant current to the LD device. The system can display the burn-in current, backlight current, forward voltage and other parameters in real time, and the graphics can be displayed intuitively, which is convenient for observing the abnormal situations in the burn-in process, the universal burn-in board is compatible with other automation equipment of our company.

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APD Integrated Burn-in System

PSS APDBI13002

APD Integrated Burn-in System

support APD TO burn-in, up to 3072 channels

APD burn-in series equipment is used for reliability evaluation and burn-in screening of TO devices such as APD, APD-TIA, PIN and PIN-TIA in optical communication industry.It supports 3072pcs single burn-in at most. The system can provide 2mA constant current, 5V constant voltage and 175°C high-temperature burn-in conditions.Meanwhile it can monitor the VBR and TIA current of the device in real time, and automatically judge the product failure.Real-time storage of monitoring data，it supports trace the burn-in failed devices, effectively improve the efficiency and reliability of TO production, and greatly improve the output and quality of device test.

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APD Desktop Burn-in Power Supply

PSS APDBI-IV

APD Desktop Burn-in Power Supply

A single unit supports 64 channels, and multiple units can be cascaded

PSS APD desktop burn-in monitoring power supply (PSS APDBI-IV) is used for burn-in APD, APD-TIA, PIN, PIN-TIA TO devices to improve the quality of the devices. The system provides APD with constant current, PIN with reverse bias voltage, and TIA with constant voltage to achieve device burn-in. At the same time, with the independent customer-supplied burn-in box, the working environment temperature of the device can be controlled to achieve the function of burn-in at high temperature. During the burn-in process, the TIA working current and APD voltage of the device are monitored and tested in real time, and the test data is recorded, and the burn-in failure device can be traced, and a single burn-in 64 APD devices can be independently burn-in.

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