Products

BAR Tester

BAR tester covering bar testing in consumer electronics such as optical communication, visable light etc., lidar and other application fields. Supports various types of BAR, including optical DFB/EML/SOA-EML, etc., various high current, narrow pulse conditions, with comprehensive test functions, including LIV, spectrum, divergence angle, polarization and other test items, also with high test efficiency;
BAR Tester
Single temperature stage (four needles) bar tester

PSS BarT-HP-ns series

Single temperature stage (four needles) bar tester

100ns narrow pulse test

PSS high-power BAR automatic tester supports high current, ns-level narrow pulse condition testing, fully automatic test BAR LIV curve, spectrum, and far-field parameters. Fully automatic loading and unloading, support loading of various specifications of material boxes, support unloading of various specifications of material boxes or blue film. Support variable temperature test, customers can set the temperature freely. Open measurement database to users for subsequent screening procedures.

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Dual temperature stage (four needles) bar tester

PSS BarT-HP-ns series

Dual temperature stage (four needles) bar tester

100ns narrow pulse test

PSS high-power BAR automatic tester supports high current, ns-level narrow pulse condition testing, fully automatic test BAR LIV curve, spectrum, and far-field parameters. Fully automatic loading and unloading, support loading of various specifications of material boxes, support unloading of various specifications of material boxes or blue film. Support variable temperature test, customers can set the temperature freely. Open measurement database to users for subsequent screening procedures.

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Optional divergence angle test

PSS BarT-HP-ns series

Optional divergence angle test

100ns narrow pulse test

PSS high-power BAR automatic tester supports high current, ns-level narrow pulse condition testing, fully automatic test BAR LIV curve, spectrum, and far-field parameters. Fully automatic loading and unloading, support loading of various specifications of material boxes, support unloading of various specifications of material boxes or blue film. Support variable temperature test, customers can set the temperature freely. Open measurement database to users for subsequent screening procedures.

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Single temperature stage (single needle) bar tester

PSS BarT-HP-us series

Single temperature stage (single needle) bar tester

Compatible with DC, Pulse power-up

Visible Light BAR automatic tester is used for automatic measurement of bar LIV curve, spectrum and far field. Fully automatic loading and unloading, support material box loading, support material box or blue film unloading. Normal temperature and high temperature dual temperature test, the test temperature can be set by the user. The probe is powered on, the test NG chip is marked with dots, and the measurement database is opened to the user for subsequent screening procedures.

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Dual temperature stage (single needle) bar tester

PSS BarT-HP-us series

Dual temperature stage (single needle) bar tester

Compatible with DC, Pulse power-up

Visible Light BAR automatic tester is used for automatic measurement of bar LIV curve, spectrum and far field. Fully automatic loading and unloading, support material box loading, support material box or blue film unloading. Normal temperature and high temperature dual temperature test, the test temperature can be set by the user. The probe is powered on, the test NG chip is marked with dots, and the measurement database is opened to the user for subsequent screening procedures.

View Details
Optional divergence angle test

PSS BarT-HP-us series

Optional divergence angle test

Compatible with DC, Pulse power-up

Visible Light BAR automatic tester is used for automatic measurement of bar LIV curve, spectrum and far field. Fully automatic loading and unloading, support material box loading, support material box or blue film unloading. Normal temperature and high temperature dual temperature test, the test temperature can be set by the user. The probe is powered on, the test NG chip is marked with dots, and the measurement database is opened to the user for subsequent screening procedures.

View Details
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