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LiDAR VCSEL COB Tester

Classification:


PSS narrow pulse integrated reliability system and performance test system are used for the reliability test of 10ns narrow pulse of LiDAR and the performance test of LiDAR SMD packaged devices. For each burn-in board of the reliability system, the burn-in current and voltage can be set independently. The burn-in box has a self-locking function to prevent misoperation during the burn-in process. The burn-in board has real-time temperature detection and supports local Access storage or SQL server storage of data.


  • Application
  • Characteristic
  • Specifications
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    • Commodity name: LiDAR VCSEL COB Tester
    • 型号: PSS PLST1602
    • Describe: LiDAR VCSEL COB narrow pulse test, supporting tests of related parameters such as LIV, spectrum, NF and FF

    PSS narrow pulse integrated reliability system and performance test system are used for the reliability test of 10ns narrow pulse of LiDAR and the performance test of LiDAR SMD packaged devices. For each burn-in board of the reliability system, the burn-in current and voltage can be set independently. The burn-in box has a self-locking function to prevent misoperation during the burn-in process. The burn-in board has real-time temperature detection and supports local Access storage or SQL server storage of data.

    Application
    1. 10ns narrow pulse reliability test of LiDAR
    2. Performance test of LiDAR SMD packaged devices

     

    Features
    Narrow pulse integrated reliability system:
    1. Support 10ns pulse output
    2. Support pulse current 30A, duty cycle ≤0.02%
    3. Two independent temperature zones, temperature set independently
    4. Parameters such as burn-in current and voltage of each burn-in board can be set independently
    5. The burn-in box has a self-locking function to prevent misoperation during burn-in
    6. Real-time temperature detection of the burn-in board
    7. Support local Access storage or SQL server data storage
    8. Temperature stability ±0.5℃
    Narrow pulse performance test:
    1. Support 10ns narrow pulse power-on test
    2. Support voltage, current, and optical power test
    3. Support spectrum test
    4. Support optical pulse waveform test
    5. Support laser near-field spot test
    6. Support far-field divergence angle test

     

     

     

     

     

     

     

     

     

     

    Test Diagram

     

     

     

     

     

     

     

     

     

     

    Electropulse Diagram

     

     

     

     

     

     

     

     

    Near Field

     

     

     

     

     

     

     

     

    Far Field, Test Divergence Angle

     

     

    Specification

    10ns Lidar chip reliability system:

     

     

     

     

     

     

     

     

     

    10ns Lidar chip test system:


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