P Series Source-Measure Unit
Classification:
P300S Series Source-Measure Unit is a high-precision, wide-dynamic-range digital touch-screen Source-Measure unit. It integrates multiple functions for voltage and current sourcing, sinking and measurement. It provides maximum output voltage up to 300V and maximum output current up to 4A with four-quadrant operation, making it widely used in various electrical-characteristics tests. Suitable for users across diverse industries, P300S Series Source-Measure Unit is ideal for characteristics analysis of modern semiconductors, nanodevices and materials, organic semiconductors, printed-electronics technologies, as well as other small-size and low-power devices.
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Application
1. Semiconductor discrete device testing
2. Optoelectronic device testing
3. Solar cell testing
4. VCSEL laser testing
5. Nanomaterial testingFeatures
1. Max output ±300V, ±1A
2. Max DC 30W available
3. Ultra-fine current and voltage measurement resolution down to 100fA/100nV
4. Maximum sampling rate up to 2MS/s for high-speed signal acquisition and dynamic testing
5. Configurable NPLC integration time from 0.000025-10, balancing speed and measurement accuracy
6. Support continuous, linear, logarithmic, custom, variable-parameter sweep and multiple operating modes
7. Synchronized trigger signal supported with adjustable polarity and pulse width
8. 2-wire/4-wire measurement supported with Guard output protection
9. Support standard SCPI command set, complete driver and sample codes providedSpecification
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