PXI Source-Measure Unit
Classification:
PSS PXIe-5116 is a 16-channel independent high-performance precision source-measure unit, capable of simultaneous voltage and current output and measurement. It supports DC/pulse output up to ±10V/±50mA with minimum pulse width down to 100μs. It supports standard source-measure unit SCPI command sets and supports PXIe Trigger and front panel DIO synchronous triggering to improve system test efficiency and reduce costs.
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Application
1. Semiconductor wafer and chip characteristics test
2. Ld laser characteristics test, silicon photonic device characteristics test
3. Solar cell charging and discharging, life test
4. Sensor and material testFeatures
1. Sixteen fully-independent source-measure channels supporting parallel testing
2. Max ±10V/±50mA output
3. Max source/sink power of 0.5W for 1CH
4. Ultra-fine resolution down to 10pA/100μV for current and voltage
5. Pulse output available, minimum pulse width 100μs, adjustable duty-cycle 0-100%
6. Maximum sampling rate up to 1MS/s for high-speed signal acquisition and dynamic testing
7. Configurable NPLC integration time from 0.001-10, balancing high speed and high accuracy measurement
8. Support multiple operating modes such as continuous, sweep and sequence
9. External synchronous trigger for 16 channels, polarity and duty-cycle adjustable
10. 2-wire/4-wire measurement supported with Guard output protection
11. Support standard SCPI command set, complete driver and sample codes providedSpecification
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