New Launch | Domestically Developed 4CH Precision Source Meter PSS SM13043: A New Option for Multi-Channel Parallel Testing

Release time:2026-10-23


 

 

 

In multi-channel synchronous power-up test scenarios, conventional solutions are commonly built by cascading multiple single-channel source meters, where power application and measurement are performed channel by channel. Such setups suffer from poor channel-to-channel synchronization and multiply the overall test time. This not only limits test throughput, but also readily introduces measurement errors caused by wiring and timing discrepancies.

 

Faced with demands for high-density parallel testing in silicon photonics wafers, laser diodes, LED, MEMS, new energy devices and multi-pin chips, must we choose between high precision and high throughput?

 

PSS delivers the answer: both can be achieved simultaneously. PSS SM13043 four-channel independent high-performance precision source meter realizes the industry’s technical vision for next-generation SMUs, enabling true parallel testing without compromising measurement accuracy.

 

01    New Product Launch

PSS SM13043 brings next-generation SMU features to a 4CH Benchtop Source Meter

 

PSS officially releases the PSS SM13043 four-channel independent high-performance precision source meter.

A single unit integrates four fully independent source-measure channels, capable of synchronous voltage and current sourcing and measurement. It supports pulsed output up to ±30V/±5A with a minimum pulse width of 100μs. Each channel can source or sink up to 30W, delivering a total combined power of 120W across all four channels.

One instrument can replace multiple single-channel SMUs. Combining channel density, pulsed dynamic performance and measurement accuracy, it boosts test throughput and optimizes system hardware cost for high-density multi-channel parallel testing.

 

02    Domestically Developed High-Performance Precision SMU

Core specifications to understand the performance limits of SM13043

 

01 Four Independent Channels, Parallel Operation Without Crosstalk

Featuring four fully isolated independent source-measure channels and on-board precision synchronization circuitry, one unit is equivalent to four standalone SMUs. It eliminates synchronization jitter caused by cascading multiple instruments and greatly improves the efficiency of multi-site parallel testing.

 

 

02 Wide-Range Output Capability

Max pulsed output: ±30V/±5 A; max DC output: ±10V/±3 A

 

 

 

 

03 Versatile Pulsed Output

Minimum pulse width: 100μs, with adjustable duty cycle from 0 to 100%. The short-pulse mode suppresses device self-heating and reveals the true transient electrical characteristics of DUTs. It is suitable for dynamic test scenarios including CW Laser CHIP/BAR, COC devices, and ELSFP external BOX light source testing.

 

 

 

04 Natively Ready for Automated Testing

Compatible with the industry-standard SMU SCPI command set. It supports general test scripts executed locally on the instrument, offloading test sequences to the device to reduce host communication latency and enabling rapid adaptation to diverse test tasks.

 

 

05 Mature Software Ecosystem

Provide free Demo projects, well-established APIs and source code for easy integration into automated test systems.

Support full pulse waveform sweep, allowing accurate sampling delay calibration without an oscilloscope, simplifying system integration.

 

 

06 Analog Output Available

Support linear and logarithmic analog output to meet special test requirements such as coupling alignment for silicon photonic devices.

 

03 Wide Application

For full-scenario parallel electrical testing of multiple devices

 

A single SM13043 supports diverse measurements ranging from chips to components, from materials to finished products:

Semiconductor wafer and chip characterization testing

Laser diode (LD) characterization testing

Solar cell charge-discharge and lifetime testing

Sensor and material testing

 

 

 

 

 

CW Laser PIV Testing

 

 

PSS SM13043 VS Keithley 2602B LIV Curve

 

 

PSS SM13043 VS Keithley 2450 LIV Curve

 

04 More Than Just Hardware

Complete supporting resources to ensure end-to-end test implementation

 

For high-precision test instruments, professional supporting resources are essential. PSS provides as below:

Fully developed measurement software and drivers, ready for immediate use

Detailed sample codes and application guides

Full-life technical support from professional application engineers

 

 

 

 

Semiconductor, optoelectronics and new energy testing are entering an era defined by high density, automation and dynamic pulse characterization. Efficiency and precision should not have to be a trade-off.

 

Following the evolutionary trend of the SMU industry, our domestically developed PSS SM13043 four-channel precision source meter integrates high-density channels, hardware synchronization, pulsed dynamic performance and programmable scripting capabilities all in one unit. One instrument delivers 4x throughput, enabling more measurements, accurate readings and faster testing. It empowers accelerated testing for R&D and mass-production lines.

 

Please contact us to obtain detailed product documentation and customized test solutions.