10ns Lidar Chip Reliability System-Module testing_TO testing

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10ns Lidar Chip Reliability System

Classification:

PSS narrow pulse integrated reliability system is used for LiDAR 10ns narrow pulse reliability test. The burn-in current and voltage parameters can be set for each burn-in board independently. The burn-in chamber has a self-locking function to prevent misoperation during the burn-in process. The burn-in board has real-time temperature detection and supports local Access storage or SQL server storage of data.

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- Commodity name: 10ns Lidar Chip Reliability System
- 型号: PSS PLSReliability
- Describe: Pulse current ≤30A, pulse voltage ≤30V, pulse width 10ns, duty cycle ≤0.02%
PSS narrow pulse integrated reliability system is used for LiDAR 10ns narrow pulse reliability test. The burn-in current and voltage parameters can be set for each burn-in board independently. The burn-in chamber has a self-locking function to prevent misoperation during the burn-in process. The burn-in board has real-time temperature detection and supports local Access storage or SQL server storage of data.

Application
1. LiDAR 10ns narrow pulse reliability test
2. LiDAR SMD packaged device performance test

Features
1. Support 10ns pulse output
2. Support pulse current 30A, duty cycle ≤0.02%
3. Two independent temperature zones, temperature set independently
4. Burn-in current and voltage parameters set independently for each burn-in board
5. The burn-in chamber has a self-locking function to prevent misoperation during the burn-in process
6. Real-time temperature detection of the burn-in board
7. Support local Access storage or SQL server storage of data
8. Temperature stability ±0.5℃

Specification