BOSA Integrated Test System
Classification:
A modular combination solution is adopted, which can be flexibly configured according to customer needs to solve the test problems of various complex OSA devices. It can realize fast testing of BOSA devices and one-click testing of complex Combo PON devices. It supports LIV comprehensive testing of DFB and EML TOSA devices with different packages, and also supports the testing of indicators such as receiving sensitivity, responsiveness and dark current of APD or PINTIA devices with different rates. It simulates the actual application environment of the device, and performs isolation and optical crosstalk tests on the internal optical path to truly reflect the performance of the device.
- Application
- Characteristic
- Specifications
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Application
1. Comprehensive testing of OSA devicesFeatures
1. Adopt a modular combination solution with flexible configuration, compatible with various BOSA & COMBO device tests, with high equipment integration and small space occupation
2. Support internal crosstalk test and effectively detects filter defects
3. A full set of fixtures, supporting various types of Flex and pin packages
4. Support sensitivity tests at different rates, with the maximum rate 25G
Specification
Device types and test conditions can be configured arbitrarily, supporting tests of parameters such as VBR, dark current, sensitivity, saturated optical power, responsivity, optical isolation, Xtalk crosstalk, Ith, forward voltage, backlight current, power, dark current/slope efficiency, Kink point and EaPo. There are mature 2.5G, 10G, 25G ROSA or BOSA test solutions, as well as comprehensive test solutions for complex Combo PON devices. The configuration models of each solution are as follows:
Each test solution is equipped with a simple-to-operate test fixture to solve all test difficulties for users.
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