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TO Test
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TO56 Automatic Disc Testing System
The PSS TO56 automated wafer testing system is suitable for automated testing of VCSEL/FP/DFB/DML TOCAN. It uses one test board to test 64 4PIN/5PIN FP/DFB TOs, supporting arbitrary pin packaging testing and LIV characteristic testing and spectral testing. This system is used in conjunction with our company's aging chamber to improve factory production and testing efficiency. It features high integration, high speed, and high stability.
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Visible light TO sorting and testing integrated machine
The TOCAN automated testing system is mainly used for automated testing of TO LIV, spectrum, and divergence angle. It supports TO56/TO9 packages with any number of pins. The equipment supports automatic loading and unloading of TOs and is compatible with customer loading and unloading fixtures. The test bench supports temperature control, enabling testing of TOs at a set temperature. The system operates fully automatically, is stable and efficient, and facilitates batch testing for customers. Used in conjunction with a high-power TO drawer aging system, it constitutes a complete reliability testing solution for high-power TOs. The TOCAN testing system supports pre- and post-aging testing and comparison, as well as data storage and analysis.
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