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test
Key words:
PSS PLT2301 pulse source is suitable for testing high-power lasers such as visible laser, Lidar TO, VCSEL array etc. It supports pulse, DC PIV characteristic curve scanning test and characteristic parameter calculation, and supports spectral characteristic test (It requires an external spectrometer). The instrument integrates the functions of pulse voltage source, ammeter, voltmeter and optical power meter, it has the characteristics of small size, fast test speed and easy to use.
Key words:
PSS PLT1403 Pulse Source is suitable for testing high-power lasers such as LiDAR TO and VCSEL arrays. It supports ns level narrow pulse, DC PIV characteristic curve scanning test and characteristic parameter calculation, and supports spectral characteristic test (an external spectrometer is required). The instrument integrates the functions of pulse voltage source, ammeter, voltmeter and optical power meter, and has the characteristics of small size, fast test speed and simple use.
Key words:
Single temperature carrier (single needle) chip tester
This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.
Key words:
Dual temperature stage (single needle) chip tester
This equipment is used for visible laser CHIP normal temperature PIV test, spectrum test and classification screening of different test results. Chips use blue film loading, automatic material seeking, Identify and locate, chips are stripped by the blue film thimble, sucked by the suction nozzle, manipulator completed the transport, visual identify and calibrate the position, automatically power on, collect luminescent parameters, test PIV/spectrum, analyze and screening, chips are classified and transported to different blue film positions by manipulator. This equipment has the characteristics of high speed and high precision, and achieves the process of complex timing and strict logic. The equipment adopts linear motor, high-precision module movement, cam and other mechanisms, cooperates with multi-axis movement, visual positioning, ORC identification and other technologies, and has mass production capacity.
Key words:
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