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Product
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50G Sampling Oscilloscope

50G Sampling Oscilloscope

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PSS DCA50021

DCA50021 optical sampling oscilloscope is used for testing of transmitter performance indicators. It supports single-channel or 4-channel optical input, NRZ and PAM4 signal testing. The optical channel bandwidth is 30GHz with a variety of typical filters. The electrical channel bandwidth is up to 50GHz. The best vertical resolution and high sampling rate ADC are used to implement continuous equivalent sampling technology, and the eye diagram reconstruction is completed in combination with the self-developed algorithm. The excellent circuit design ensures that the system noise is as low as 3uw or less, and is equipped with a calibrated reference receiver (in line with industry tolerance standards), which perfectly meets the industry's needs for accurate testing of digital waveforms. High-precision, low-noise, low-cost, fast sampling oscilloscopes provide customers with a one-stop solution for optoelectronic performance testing.

4-channel optical signal input, NRZ and PAM4 signal testing, electrical channel bandwidth 50GHz, optical channel bandwidth 30GHz, 850nm~1650nm wavelength

Benchtop Source-Measure Unit

Benchtop Source-Measure Unit

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PSS SM11041

PSS SM11041 is a 4-channel independent high-performance precision source meter that can output and measure voltage and current simultaneously, supporting up to ±10V, ±100mA DC/pulse output, and minimum pulse width of 100μs. It supports Gigabit Ethernet and RS422 serial communication, source meter standard SCPI instruction set, and synchronous triggering of multiple source meters, which improves system test efficiency and reduces costs.

4-channel, voltage ±10V, current ±100mA, pulse width≥100μs, resolution 10pA/100μV, power 1W/CH duty cycle ≤0.5%

COB Tester

COB Tester

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PSS COBT2001

PSS COBT2001 automatic test system is applicable for module testing needs before and after optical coupling of VCSEL multi-mode packages. The equipment not only verifies the function of the COB module itself and the reliability of the optical part, but is also used for reliability verification testing of VCSEL optical chips. The unique light receiving device can cover test objects of different powers and ensure the repeatability of power testing. It supports tests of related parameters such as VCC, ICC, PO, ITH and SE. The equipment has the characteristics of good consistency, high reliability and efficient production. It is compatible with PSS burn-in boards and other brands of burn-in boards, supports dual-board 4-station parallel testing, and completes testing of packages such as SFP, QSFP, QSFP-DD and OSFP in one stop.

Optical engine COB test, supporting tests of related parameters such as DDMI, Ith and SE

100G Clock Data Recovery

100G Clock Data Recovery

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PSS CDR100G2

PSS clock data recovery is a high-performance, cost-effective CDR product that can extract low-jitter clock signals from data signals of the environments such as optical modules or backplanes. The series covers 24.33~28.05GBd NRZ/PAM4, 49.76~56GBd NRZ/PAM4 rates, supports the use of the full band 800~1650nm, is easy to operate, and supports signal integrity analysis of high-speed optical devices and optical modules.

Support 24.33~28.05GBd NRZ/PAM4, 49.76~56GBd NRZ/PAM4 optical signal clock recovery

Visible Laser COB Automated Tester

Visible Laser COB Automated Tester

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PSS_COBT10201

PSS COB automatic testing system is mainly used for the performance testing of visible laser COB modules. It is equipped with a fully automatic loading and unloading manipulator to achieve a high degree of automation, reduce manual operation and intervention and have high testing efficiency.

Visible laser COB module test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

800G BERT with MCB & Temperature Control Integrated

800G BERT with MCB & Temperature Control Integrated

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PSS MDTP800G1

PSS 800G BERT with MCB & Temperature Control Integrated (PSS MDTP800G1) integrates an optical port high-speed signal error performance analyzer, a tri-temperature TEC plus liquid cooling control system, and an internal MCB board, supporting direct insertion testing of modules such as 400G/800G OSFP, QSFP-DD, and QSFP112. It supports multiple types of configurations. The number of ports and packaging can be adapted according to user needs. Compared with the traditional configuration (BERT + cable + MCB board), it reduces the test bench space and reduces the test cost.

Support multi-station tri-temperature integrated testing of OSFP, QSFP-DD, QSFP112 series packaging products

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