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OSA Test
Key words:
PIV intelligent coupling power supply
PSS PIV-LS is mainly used for online monitoring during the coupling of LD, TOSA, and BOSA. The system provides the LD of the OSA device with a drive power supply and monitors a series of related performance indicators in real time during the coupling process. Monitorable parameters include: threshold current, drive current, back light current, optical power, forward voltage, etc. It displays related parameters on the local machine, as well as P-I curve, Im-I curve, V-I curve, etc., and can also connect an oscilloscope to display related waveforms.
Key words:
PIV intelligent coupling power supply
The PSS PIV-X is mainly used for online monitoring during LD, TOSA, and BOSA coupling. The system provides the OSA device's LD with a drive power supply and monitors a series of relevant performance indicators during the coupling process in real time. Monitorable parameters include: threshold current, drive current, backlight current, optical power, backlight voltage, etc. The system displays relevant parameters on the local device, as well as P-I curves, Im-I curves, V-I curves, etc. An external oscilloscope can also be connected to display relevant waveforms.
Key words:
Purseus adopts a plug-in combination scheme, flexibly configured according to customer needs, to solve the testing problems of OSA devices with various complex structures. It can realize the rapid testing of BOSA devices and the one-key testing of complex Combo PON devices. It supports the comprehensive LIV testing of DFB and EML TOSA devices with different packages, and also supports the testing of receiving sensitivity, responsivity, dark current and other indicators of APD or PINTIA devices with different rates. It simulates the actual application environment of the device and performs internal optical path isolation and crosstalk tests to truly reflect the performance of the device.
Key words:
ComboPon device comprehensive test system
Purseus adopts a plug-in combination scheme, flexibly configured according to customer needs, to solve the testing problems of various OSA devices with complex structures. It can realize the rapid testing of BOSA devices and the one-key testing of Combo PON devices with complex structures. It supports the comprehensive LIV testing of DFB and EML TOSA devices with different packages, and also supports the testing of receiving sensitivity, responsivity, dark current and other indicators of APD or PINTIA devices with different rates. It simulates the actual application environment of the devices and performs isolation and crosstalk tests of the internal optical path to truly reflect the performance of the devices.
Key words:
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