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Data Communication COC Tester

Data Communication COC Tester

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PSS COC3T19201

PSS COCT2000 supports LIV comprehensive test and spectrum test of COC devices (supporting DFB/EML/Tunable) at normal/high temperature. Used in conjunction with our COC burn-in system, it can screen out defective products by comparing the test before and after burn-in. It has the characteristics of high integration, high efficiency and high stability.

DFB and EML laser chip testing for COC packaging, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Data Communication TO Tri-temperature Tester

Data Communication TO Tri-temperature Tester

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PSS LDTO3T8002

PSS TO three-temperature test system supports industrial-grade low/normal/high temperature tests for TOs. The temperature control range is -40°C to 85°C. It is applicable for automatic testing of VCSEL/FP/DFB-TOCAN, supporting device any pin packaging tests, LIV characteristic tests and spectrum tests. The system supports two fixtures for testing at a time, and each fixture can load 128 TOs, which improves test output. The system has the characteristics of fast temperature control, good temperature uniformity, good stability and reliability and high test efficiency.

DFB or EML TO industrial tri-temperature test, supporting tests of optoelectronic characteristics such as LIV, spectrum and divergence angle

Data Communication TO46 Disk Tester

Data Communication TO46 Disk Tester

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PSS PAT-46-I(E)

In order to improve the reliability of optical devices, optical devices will undergo performance testing before TO packaging to prevent defective devices from flowing into the next production process to cause losses in manpower and material resources. Wuhan PSS TO-46 automatic test system is mainly used to automatically test the performance characteristics such as breakdown voltage, dark current, working current, responsiveness and D+/D- of 64 devices, with the characteristics of high integration, high speed and high stability.

APDTIA/PINTIA TO test, supporting tests of optoelectronic characteristics such as breakdown voltage, responsivity and dark current

Data Communication TO56/EML TO Disk Tester

Data Communication TO56/EML TO Disk Tester

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PSS PAT5606

PSS TO56 automatic disk test system is applicable for automatic testing of VCSEL/FP/DFB/DML/EML/SOA-EML-TOCAN. It uses one test board to test 64 4PIN/5PIN FP/DFB TOs or 32 7PIN/8PIN DML/EML TOs. It supports any pin package testing, high temperature testing, TEC temperature control, LIV characteristic testing and spectrum testing. This system is used in conjunction with our burn-in box to improve factory production and testing efficiency. It has the characteristics of high integration, high speed and high stability.

DFB or EML TO test, supporting tests of optoelectronic characteristics such as LIV and spectrum

LiDAR VCSEL COB Tester

LiDAR VCSEL COB Tester

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PSS PLST1602

PSS narrow pulse integrated reliability system and performance test system are used for the reliability test of 10ns narrow pulse of LiDAR and the performance test of LiDAR SMD packaged devices. For each burn-in board of the reliability system, the burn-in current and voltage can be set independently. The burn-in box has a self-locking function to prevent misoperation during the burn-in process. The burn-in board has real-time temperature detection and supports local Access storage or SQL server storage of data.

LiDAR VCSEL COB narrow pulse test, supporting tests of related parameters such as LIV, spectrum, NF and FF

LiDAR TO Tester

LiDAR TO Tester

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PSS PLST401

PSS narrow pulse TO test fixture is used for testing high-power pulse packaged devices of LiDAR. It has a small size and high integration. It is suitable for small batch test and verification environments such as R&D.

LiDAR VCSEL TO narrow pulse test, supporting tests of related parameters such as LIV, spectrum, NF and FF

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