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P Series Source-Measure Unit

P Series Source-Measure Unit

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P300C

P300C Series Source-Measure Unit is a high-precision, wide-dynamic-range digital touch-screen Source-Measure unit. It integrates multiple functions for voltage and current sourcing, sinking and measurement. It provides maximum output voltage up to 300V and maximum output current up to 4A with four-quadrant operation, making it widely used in various electrical-characteristics tests. Suitable for users across diverse industries, P300C Series Source-Measure Unit is ideal for characteristics analysis of modern semiconductors, nanodevices and materials, organic semiconductors, printed-electronics technologies, as well as other small-size and low-power devices.

Voltage ±300V, current ±4A, power 40W/CH

OCS

OCS

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PSS OCS32X321

PSS OCS32X321 is a high-precision, automated comprehensive test platform tailored for OCS optical matrix switch deployed in data centers and AI computing clusters. The platform addresses key-parameter measurements for high-isolation optical matrix switches (e.g., 3D-MEMS, 2D-MEMS, LCOS and waveguide chips) during R&D, quality inspection and mass-scale production.

32CH light source, 32CH optical power meter matrix

P Series Source-Measure Unit

P Series Source-Measure Unit

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P300S

P300S Series Source-Measure Unit is a high-precision, wide-dynamic-range digital touch-screen Source-Measure unit. It integrates multiple functions for voltage and current sourcing, sinking and measurement. It provides maximum output voltage up to 300V and maximum output current up to 4A with four-quadrant operation, making it widely used in various electrical-characteristics tests. Suitable for users across diverse industries, P300S Series Source-Measure Unit is ideal for characteristics analysis of modern semiconductors, nanodevices and materials, organic semiconductors, printed-electronics technologies, as well as other small-size and low-power devices.

Voltage ±300V, current ±1A, power 40W/CH

Constant Current Pulse Source

Constant Current Pulse Source

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PSS PLT2303

PSS PLT2303 pulse source is mainly used for testing of high-power lasers such as RGB Chip, COS/COC, TO and Bar. It supports the sweep test of pulse and DC PIV characteristic curves and the calculation of characteristic parameters, the reverse leakage current test, VBR test and test of spectral characteristics (external spectrometer required). It integrates the functions of pulse current source, ammeter, voltmeter and optical power meter, and has the characteristics of small volume, fast test speed and simple use.

Voltage ±10V, current ±10A, minimum pulse width 5μs, duty cycle 0~100%

COS Automatic Test System

COS Automatic Test System

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PSS COST22401

PSS COS Automatic Test System (PSS COST22401) supports comprehensive LIV testing and spectral testing at room/high temperature for CW-DFB laser chips in COS package form. It supports us-level DC/pulse output and measurement. The system adopts dual-station testing with fully automatic robotic loading and unloading. It features high integration, high efficiency, high stability, and simple maintenance and operation.

Applicable for testing high-power DFB laser chips for COS packaging; with automatic loading and unloading, supporting LIV and spectral characteristic testing

LiNbO3 Automatic Test System

LiNbO3 Automatic Test System

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PSS CHIP LiNbO3

PSS Normal/High-Temperature Thin-film Lithium Niobate Automatic Tester (PSS CHIP-LiNbO₃) is applied to the coupling test of lithium niobate (LiNbO₃) chips, supporting the testing of optoelectronic characteristics including thermal resistance, thermal tuning power, half-wave voltage and spectrum. Adopting a single load platform per test system, the platform temperature control range is 25~85℃. It features fully automatic loading and unloading. Measurement data is open to users for subsequent sorting processes.

Integrate comprehensive test functions, supporting thermal resistance, thermal tuning power, extinction ratio, minimum insertion loss, half-wave voltage, optical spectrum testing, and OCR recognition of chip codes

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